1μm-thickness 64-channel surface electromyogram measurement sheet with 2V organic transistors for prosthetic hand control

Hiroshi Fuketa, Kazuaki Yoshioka, Yasuhiro Shinozuka, Koichi Ishida, Tomoyuki Yokota, Naoji Matsuhisa, Yusuke Inoue, Masaki Sekino, Tsuyoshi Sekitani, Makoto Takamiya, Takao Someya, Takayasu Sakurai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

24 Citations (Scopus)

Abstract

A surface electromyogram (EMG), which measures a voltage waveform produced by skeletal muscles on skin, is an important tool for applications detecting the human will of motion, such as for prosthetic hands and prosthetic legs. In the application to a prosthetic hand, a multipoint EMG measurement is required to precisely control the hand [1, 2]. Conventional multipoint measurements with a passive electrode array [1-3], however, have two problems: 1) Measurement over a long time period is annoying, because the EMG electrodes placed on the skin are rigid, and 2) the signal integrity of EMG is degraded, because the number of wires between the electrodes and the front-end circuits increases with increasing number of measurement points. To address these challenges, a surface EMG measurement sheet (SEMS) on which an EMG electrode array and a front-end amplifier array with 2V organic transistors are integrated on a 1μm-thick ultra-flexible film is developed to control prosthetic hands. The developed SEMS enables a comfortable long-time measurement without signal integrity degradation.

Original languageEnglish
Title of host publication2013 IEEE International Solid-State Circuits Conference, ISSCC 2013 - Digest of Technical Papers
Pages104-105
Number of pages2
DOIs
Publication statusPublished - 2013
Externally publishedYes
Event2013 60th IEEE International Solid-State Circuits Conference, ISSCC 2013 - San Francisco, CA, United States
Duration: 2013 Feb 172013 Feb 21

Publication series

NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume56
ISSN (Print)0193-6530

Other

Other2013 60th IEEE International Solid-State Circuits Conference, ISSCC 2013
Country/TerritoryUnited States
CitySan Francisco, CA
Period13/2/1713/2/21

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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