TY - JOUR
T1 - A 1 TB/s 1 pJ/b 6.4 mm 2/TB/s QDR inductive-coupling interface between 65-nm CMOS logic and emulated 100-nm DRAM
AU - Miura, Noriyuki
AU - Saito, Mitsuko
AU - Kuroda, Tadahiro
N1 - Funding Information:
Manuscript received December 30, 2011; revised March 09, 2012; accepted March 24, 2012. Date of publication May 14, 2012; date of current version June 07, 2012. This work was supported by CREST/JST. The VLSI chip in this study has been fabricated in the chip fabrication program of VDEC, the University of Tokyo in collaboration with STARC, e-Shuttle, Inc., and Fujitsu Ltd. This paper was recommended by Guest Editor K. Choi.
PY - 2012
Y1 - 2012
N2 - 1 TB/s 1 pJ/b 6.4 mm 2/TB/s inductive-coupling interface between 65-nm complementary metal-oxide-semiconductor (CMOS) logic and emulated 100-nm dynamic random access memory (DRAM) is developed. BER <10 -16 operation is examined in 1024-bit parallel links. Compared to the latest wired 40-nm DRAM interface, the bandwidth is increased to 32 ×, and the energy consumption and the layout area are reduced to 1/8 and 1/22, respectively.
AB - 1 TB/s 1 pJ/b 6.4 mm 2/TB/s inductive-coupling interface between 65-nm complementary metal-oxide-semiconductor (CMOS) logic and emulated 100-nm dynamic random access memory (DRAM) is developed. BER <10 -16 operation is examined in 1024-bit parallel links. Compared to the latest wired 40-nm DRAM interface, the bandwidth is increased to 32 ×, and the energy consumption and the layout area are reduced to 1/8 and 1/22, respectively.
KW - High-bandwidth interface
KW - inductive coupling
KW - memory-processor stacking
KW - three-dimensional integration
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U2 - 10.1109/JETCAS.2012.2193836
DO - 10.1109/JETCAS.2012.2193836
M3 - Article
AN - SCOPUS:84862336016
SN - 2156-3357
VL - 2
SP - 249
EP - 256
JO - IEEE Journal on Emerging and Selected Topics in Circuits and Systems
JF - IEEE Journal on Emerging and Selected Topics in Circuits and Systems
IS - 2
M1 - 6199998
ER -