@inproceedings{a49f9eecec074eec809d7687019b711c,
title = "A first-principles core-level XPS study on the boron impurities in germanium crystal",
abstract = "We systematically investigated the x-ray photoelectron spectroscopy (XPS) core-level shifts and formation energies of boron defects in germanium crystals and compared the results to those in silicon crystals. Both for XPS core-level shifts and formation energies, relationship between defects in Si and Ge is roughly linear. From the similarity in the formation energy, it is expected that the exotic clusters like icosahedral B12 exist in Ge as well as in Si.",
keywords = "XPS(x-ray photoelectron spectroscopy), boron, cluster, defect, first-principles study, germanium",
author = "Jun Yamauchi and Yoshihide Yoshimoto and Yuji Suwa",
year = "2013",
doi = "10.1063/1.4848275",
language = "English",
isbn = "9780735411944",
series = "AIP Conference Proceedings",
publisher = "American Institute of Physics Inc.",
pages = "41--42",
booktitle = "Physics of Semiconductors - Proceedings of the 31st International Conference on the Physics of Semiconductors, ICPS 2012",
note = "31st International Conference on the Physics of Semiconductors, ICPS 2012 ; Conference date: 29-07-2012 Through 03-08-2012",
}