A method for calculating thermal radiation properties of multilayer films from optical constants

R. Horikoshi; Y. Nagasaka; A. Ohnishi

doi:10.1023/A:1022534015586

A method for calculating thermal radiation properties of multilayer films from optical constants

R. Horikoshi, Y. Nagasaka, A. Ohnishi

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

A calculation method for the incident angle dependence of the solar absorptance α_s and the temperature dependence of the total hemispherical emittance ε_H of multilayer films is proposed. The method is based on calculation of α_s and ε_H from optical constants in the wavelength region from 0.25 to 100 μm for thin polymer films and deposited metal. In this paper we provide values of α_s in the incident angle region from 0 to 90° and ε_H in the temperature range from 173.15 to 373.15 K for two-layer samples of aluminum-deposited polyamide film. The results obtained for as and ε_H by the present method are compared with experimental results measured by both spectroscopic and calorimetric methods. The calculated results of α_s and ε_H agree well with the experimental results.

Original language	English
Pages (from-to)	547-555
Number of pages	9
Journal	International Journal of Thermophysics
Volume	19
Issue number	2 SPEC.ISS.
DOIs	https://doi.org/10.1023/A:1022534015586
Publication status	Published - 1998 Mar
Externally published	Yes

Keywords

Multilayer films
Optical constants
Reflectance
Solar absorptance
Total hemispherical emittance

ASJC Scopus subject areas

Condensed Matter Physics

Access to Document

10.1023/A:1022534015586

Cite this

@article{c3246f95a63047f4a3ad74c2f67dce09,

title = "A method for calculating thermal radiation properties of multilayer films from optical constants",

abstract = "A calculation method for the incident angle dependence of the solar absorptance αs and the temperature dependence of the total hemispherical emittance εH of multilayer films is proposed. The method is based on calculation of αs and εH from optical constants in the wavelength region from 0.25 to 100 μm for thin polymer films and deposited metal. In this paper we provide values of αs in the incident angle region from 0 to 90° and εH in the temperature range from 173.15 to 373.15 K for two-layer samples of aluminum-deposited polyamide film. The results obtained for as and εH by the present method are compared with experimental results measured by both spectroscopic and calorimetric methods. The calculated results of αs and εH agree well with the experimental results.",

keywords = "Multilayer films, Optical constants, Reflectance, Solar absorptance, Total hemispherical emittance",

author = "R. Horikoshi and Y. Nagasaka and A. Ohnishi",

year = "1998",

month = mar,

doi = "10.1023/A:1022534015586",

language = "English",

volume = "19",

pages = "547--555",

journal = "International Journal of Thermophysics",

issn = "0195-928X",

publisher = "Springer New York",

number = "2 SPEC.ISS.",

}

TY - JOUR

T1 - A method for calculating thermal radiation properties of multilayer films from optical constants

AU - Horikoshi, R.

AU - Nagasaka, Y.

AU - Ohnishi, A.

PY - 1998/3

Y1 - 1998/3

N2 - A calculation method for the incident angle dependence of the solar absorptance αs and the temperature dependence of the total hemispherical emittance εH of multilayer films is proposed. The method is based on calculation of αs and εH from optical constants in the wavelength region from 0.25 to 100 μm for thin polymer films and deposited metal. In this paper we provide values of αs in the incident angle region from 0 to 90° and εH in the temperature range from 173.15 to 373.15 K for two-layer samples of aluminum-deposited polyamide film. The results obtained for as and εH by the present method are compared with experimental results measured by both spectroscopic and calorimetric methods. The calculated results of αs and εH agree well with the experimental results.

AB - A calculation method for the incident angle dependence of the solar absorptance αs and the temperature dependence of the total hemispherical emittance εH of multilayer films is proposed. The method is based on calculation of αs and εH from optical constants in the wavelength region from 0.25 to 100 μm for thin polymer films and deposited metal. In this paper we provide values of αs in the incident angle region from 0 to 90° and εH in the temperature range from 173.15 to 373.15 K for two-layer samples of aluminum-deposited polyamide film. The results obtained for as and εH by the present method are compared with experimental results measured by both spectroscopic and calorimetric methods. The calculated results of αs and εH agree well with the experimental results.

KW - Multilayer films

KW - Optical constants

KW - Reflectance

KW - Solar absorptance

KW - Total hemispherical emittance

UR - http://www.scopus.com/inward/record.url?scp=0032026121&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032026121&partnerID=8YFLogxK

U2 - 10.1023/A:1022534015586

DO - 10.1023/A:1022534015586

M3 - Article

AN - SCOPUS:0032026121

SN - 0195-928X

VL - 19

SP - 547

EP - 555

JO - International Journal of Thermophysics

JF - International Journal of Thermophysics

IS - 2 SPEC.ISS.

ER -

A method for calculating thermal radiation properties of multilayer films from optical constants

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this