TY - GEN
T1 - A study on the effect of inspection time on defect detection in visual inspection
AU - Nakajima, Ryosuke
AU - Shida, Keisuke
AU - Matsumoto, Toshiyuki
N1 - Publisher Copyright:
© IFIP International Federation for Information Processing 2013.
PY - 2013
Y1 - 2013
N2 - In order to consider the visual inspection utilizing the peripheral vision, this paper examines the inspection times that affect defect detection. The fixation duration and the distance between defect and the fixation point are experimental factors in determining the inspection time. As the result, in case of a large sized defect, the detection rate is high regardless of the fixation duration and the distance between the defect and the fixation point. In case of a small sized defect, when the fixation duration is longer and the distance between the defect and the fixation point is closer, the defect detection rate is higher. Moreover, as the result of conducting multiple linear regression analysis about the experiment factors, it is obtained that judging from standardized partial regression coefficient of factors, higher defect size, less the distance between defect and the fixation point, the higher fixation duration, is proved to improve the defect detection.
AB - In order to consider the visual inspection utilizing the peripheral vision, this paper examines the inspection times that affect defect detection. The fixation duration and the distance between defect and the fixation point are experimental factors in determining the inspection time. As the result, in case of a large sized defect, the detection rate is high regardless of the fixation duration and the distance between the defect and the fixation point. In case of a small sized defect, when the fixation duration is longer and the distance between the defect and the fixation point is closer, the defect detection rate is higher. Moreover, as the result of conducting multiple linear regression analysis about the experiment factors, it is obtained that judging from standardized partial regression coefficient of factors, higher defect size, less the distance between defect and the fixation point, the higher fixation duration, is proved to improve the defect detection.
KW - Effective field of view
KW - Inspection time
KW - Peripheral vision
KW - Visual inspection
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U2 - 10.1007/978-3-642-41266-0_4
DO - 10.1007/978-3-642-41266-0_4
M3 - Conference contribution
AN - SCOPUS:84923055199
T3 - IFIP Advances in Information and Communication Technology
SP - 29
EP - 39
BT - Advances in Production Management Systems
A2 - Prabhu, Vittal
A2 - Taisch, Marco
A2 - Kiritsis, Dimitris
PB - Springer New York LLC
T2 - IFIP WG 5.7 International Conference on Advances in Production Management Systems, APMS 2013
Y2 - 9 September 2013 through 12 September 2013
ER -