TY - GEN
T1 - A System delay monitor exploiting automatic cell-based design flow and post-silicon calibration
AU - Okuhara, Hayate
AU - Kazami, Ryosuke
AU - Amano, Hideharu
N1 - Funding Information:
This work was supported by by JSPS under Grant 17J04659. The VLSI chip in this study has been fabricated in the chip fabrication program of VLSI Design and Education Center(VDEC), the University of Tokyo in collaboration with Renesas Electronics Corp.
Publisher Copyright:
© 2019 IEEE.
PY - 2019/10
Y1 - 2019/10
N2 - In this work, we present a low-overhead performance monitor which can emulate the maximum operational frequency of a target system by utilizing a delay chain so as to achieve efficient adaptive voltage control. The proposed monitor can be fully built by logic cells provided by general PDKs; thus, an automatic cell-based design flow can be used for its implementation. In addition, interconnect delay behaviors can also be imitated by exploiting wires which are automatically routed. In order to validate our concept, the proposed monitor is fabricated with a 65-nm Fully Depleted Silicon on Insulator (FD-SOI) technology. Real chip experiments reveal that the automated layout design can achieve the reasonable ability to delay emulation. Indeed, when the maximum operational frequency of a CNN accelerator is emulated, the proposed SDM achieved several percents of the performance tracking error. Also, its power overhead is only few percents.
AB - In this work, we present a low-overhead performance monitor which can emulate the maximum operational frequency of a target system by utilizing a delay chain so as to achieve efficient adaptive voltage control. The proposed monitor can be fully built by logic cells provided by general PDKs; thus, an automatic cell-based design flow can be used for its implementation. In addition, interconnect delay behaviors can also be imitated by exploiting wires which are automatically routed. In order to validate our concept, the proposed monitor is fabricated with a 65-nm Fully Depleted Silicon on Insulator (FD-SOI) technology. Real chip experiments reveal that the automated layout design can achieve the reasonable ability to delay emulation. Indeed, when the maximum operational frequency of a CNN accelerator is emulated, the proposed SDM achieved several percents of the performance tracking error. Also, its power overhead is only few percents.
KW - Adaptive voltage control
KW - Low power design
KW - Performance monitor
KW - VLSI systems
UR - http://www.scopus.com/inward/record.url?scp=85076167396&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85076167396&partnerID=8YFLogxK
U2 - 10.1109/MCSoC.2019.00012
DO - 10.1109/MCSoC.2019.00012
M3 - Conference contribution
AN - SCOPUS:85076167396
T3 - Proceedings - 2019 IEEE 13th International Symposium on Embedded Multicore/Many-Core Systems-on-Chip, MCSoC 2019
SP - 32
EP - 37
BT - Proceedings - 2019 IEEE 13th International Symposium on Embedded Multicore/Many-Core Systems-on-Chip, MCSoC 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 13th IEEE International Symposium on Embedded Multicore/Many-Core Systems-on-Chip, MCSoC 2019
Y2 - 1 October 2019 through 4 October 2019
ER -