TY - GEN
T1 - A triple-scale crystal plasticity simulation on yield behavior of annealed FCC fine-grained metals
AU - Kurosawa, Eisuke
AU - Aoyagi, Yoshiteru
AU - Tadano, Yuichi
AU - Shizawa, Kazuyuki
PY - 2008
Y1 - 2008
N2 - In this study, the conventional Bailey-Hirsch's relationship is extended in order to express the increase of critical resolved shear stress due to the lack of dislocation lines in a grain. This model is introduced into a triple-scale crystal plasticity model based on geometrically necessary crystal defects and the homogenization method. A FE simulation is carried out based on the proposed model for FCC polycrystals with different grain sizes. It is numerically predicted that yield behavior of fine-grained metals depends on the initial dislocation density and the initial grain size. Furthermore, yield point drop that is observed in annealed FCC fine-grained metal can be reproduced.
AB - In this study, the conventional Bailey-Hirsch's relationship is extended in order to express the increase of critical resolved shear stress due to the lack of dislocation lines in a grain. This model is introduced into a triple-scale crystal plasticity model based on geometrically necessary crystal defects and the homogenization method. A FE simulation is carried out based on the proposed model for FCC polycrystals with different grain sizes. It is numerically predicted that yield behavior of fine-grained metals depends on the initial dislocation density and the initial grain size. Furthermore, yield point drop that is observed in annealed FCC fine-grained metal can be reproduced.
KW - Crystal plasticity
KW - Geometrically necessary dislocation
KW - Homogenization method
KW - Size effect
KW - Ultrafine-grained metal
KW - Yield point drop
UR - http://www.scopus.com/inward/record.url?scp=56349111534&partnerID=8YFLogxK
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U2 - 10.4028/www.scientific.net/msf.584-586.1027
DO - 10.4028/www.scientific.net/msf.584-586.1027
M3 - Conference contribution
AN - SCOPUS:56349111534
T3 - Materials Science Forum
SP - 1027
EP - 1032
BT - Materials Science Forum - Nanomaterials by Severe Plastic Deformation 4 - 4th International Conference on Nanomaterials by Severe Plastic Deformation
PB - Trans Tech Publications Ltd
T2 - 4th International Conference on Nanomaterials by Severe Plastic Deformation
Y2 - 18 August 2008 through 22 August 2008
ER -