Adaptive optics with spatio-temporal lock-in detection for temporal focusing microscopy

Tomohiro Ishikawa; Keisuke Isobe; Kenta Inazawa; Kana Namiki; Atsushi Miyawaki; Fumihiko Kannari; Katsumi Midorikawa

doi:10.1364/OE.432414

Adaptive optics with spatio-temporal lock-in detection for temporal focusing microscopy

Tomohiro Ishikawa, Keisuke Isobe, Kenta Inazawa, Kana Namiki, Atsushi Miyawaki, Fumihiko Kannari, Katsumi Midorikawa

Department of Electronics and Electrical Engineering

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

Wavefront distortion in temporal focusing microscopy (TFM) results in a distorted temporal profile of the excitation pulses owing to spatio-temporal coupling. Since the pulse duration is dramatically changed in the excitation volume, it is difficult to correct the temporal profile for a thick sample. Here, we demonstrate adaptive optics (AO) correction in a thick sample. We apply structured illumination microscopy (SIM) to an AO correction in wide-field TFM to decrease the change in the pulse duration in the signal detection volume. The AO correction with SIM was very successful in a thick sample for which AO correction with TFM failed.

Original language	English
Pages (from-to)	29021-29033
Number of pages	13
Journal	Optics Express
Volume	29
Issue number	18
DOIs	https://doi.org/10.1364/OE.432414
Publication status	Published - 2021 Aug 30

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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abstract = "Wavefront distortion in temporal focusing microscopy (TFM) results in a distorted temporal profile of the excitation pulses owing to spatio-temporal coupling. Since the pulse duration is dramatically changed in the excitation volume, it is difficult to correct the temporal profile for a thick sample. Here, we demonstrate adaptive optics (AO) correction in a thick sample. We apply structured illumination microscopy (SIM) to an AO correction in wide-field TFM to decrease the change in the pulse duration in the signal detection volume. The AO correction with SIM was very successful in a thick sample for which AO correction with TFM failed.",

author = "Tomohiro Ishikawa and Keisuke Isobe and Kenta Inazawa and Kana Namiki and Atsushi Miyawaki and Fumihiko Kannari and Katsumi Midorikawa",

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AU - Ishikawa, Tomohiro

AU - Isobe, Keisuke

AU - Inazawa, Kenta

AU - Namiki, Kana

AU - Miyawaki, Atsushi

AU - Kannari, Fumihiko

AU - Midorikawa, Katsumi

N1 - Funding Information: This work was supported by the RIKEN Junior Research Associate Program. Publisher Copyright: © 2021 Optical Society of America under the terms of the OSA Open Access Publishing Agreement.

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Y1 - 2021/8/30

N2 - Wavefront distortion in temporal focusing microscopy (TFM) results in a distorted temporal profile of the excitation pulses owing to spatio-temporal coupling. Since the pulse duration is dramatically changed in the excitation volume, it is difficult to correct the temporal profile for a thick sample. Here, we demonstrate adaptive optics (AO) correction in a thick sample. We apply structured illumination microscopy (SIM) to an AO correction in wide-field TFM to decrease the change in the pulse duration in the signal detection volume. The AO correction with SIM was very successful in a thick sample for which AO correction with TFM failed.

AB - Wavefront distortion in temporal focusing microscopy (TFM) results in a distorted temporal profile of the excitation pulses owing to spatio-temporal coupling. Since the pulse duration is dramatically changed in the excitation volume, it is difficult to correct the temporal profile for a thick sample. Here, we demonstrate adaptive optics (AO) correction in a thick sample. We apply structured illumination microscopy (SIM) to an AO correction in wide-field TFM to decrease the change in the pulse duration in the signal detection volume. The AO correction with SIM was very successful in a thick sample for which AO correction with TFM failed.

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Adaptive optics with spatio-temporal lock-in detection for temporal focusing microscopy

Abstract

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