Analysis and evaluation of electromagnetic interference between ThruChip interface and LC-VCO

Junichiro Kadomoto; So Hasegawa; Yusuke Kiuchi; Atsutake Kosuge; Tadahiro Kuroda

doi:10.1587/transele.E99.C.659

Analysis and evaluation of electromagnetic interference between ThruChip interface and LC-VCO

Junichiro Kadomoto, So Hasegawa, Yusuke Kiuchi, Atsutake Kosuge, Tadahiro Kuroda

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.

Original language	English
Pages (from-to)	659-662
Number of pages	4
Journal	IEICE Transactions on Electronics
Volume	E99C
Issue number	6
DOIs	https://doi.org/10.1587/transele.E99.C.659
Publication status	Published - 2016 Jun

Keywords

3D integration
EMI
LC-VCO
TCI

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1587/transele.E99.C.659

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title = "Analysis and evaluation of electromagnetic interference between ThruChip interface and LC-VCO",

abstract = "This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.",

keywords = "3D integration, EMI, LC-VCO, TCI",

author = "Junichiro Kadomoto and So Hasegawa and Yusuke Kiuchi and Atsutake Kosuge and Tadahiro Kuroda",

note = "Funding Information: This work was supported by CREST/JST. Publisher Copyright: Copyright {\textcopyright} 2016 The Institute of Electronics, Information and Communication Engineers. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.",

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AU - Hasegawa, So

AU - Kiuchi, Yusuke

AU - Kosuge, Atsutake

AU - Kuroda, Tadahiro

N1 - Funding Information: This work was supported by CREST/JST. Publisher Copyright: Copyright © 2016 The Institute of Electronics, Information and Communication Engineers. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.

PY - 2016/6

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N2 - This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.

AB - This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.

KW - 3D integration

KW - EMI

KW - LC-VCO

KW - TCI

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ER -

Analysis and evaluation of electromagnetic interference between ThruChip interface and LC-VCO

Abstract

Keywords

ASJC Scopus subject areas

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