TY - JOUR
T1 - Asymmetric Body Bias Control With Low-Power FD-SOI Technologies
T2 - Modeling and Power Optimization
AU - Okuhara, Hayate
AU - Ben Ahmed, Akram
AU - Kühn, Johannes Maximilian
AU - Amano, Hideharu
N1 - Funding Information:
Manuscript received October 18, 2017; revised January 22, 2018; accepted February 27, 2018. Date of publication March 23, 2018; date of current version June 26, 2018. This work was supported in part by the Ministry of Economy, Trade and Industry and the New Energy and Industrial Technology Development Organization through the project “Ultralow Voltage Device Project,” in part by the JSPS KAKENHI S under Grant 25220002, and in part by the JSPS under Grant 17J04659. (Corresponding author: Hayate Okuhara.) The authors are with the Department of Information and Computer Science, Keio University, Kanagawa 223-0061, Japan (e-mail: hayate@ am.ics.keio.ac.jp; akram@am.ics.keio.ac.jp; kuehnj@am.ics.keio.ac.jp; hunga@am.ics.keio.ac.jp).
Publisher Copyright:
© 2018 IEEE.
PY - 2018/7
Y1 - 2018/7
N2 - Body bias control is a fundamental technique widely used to provide an efficient tradeoff between leakage power and performance in ultralow-power systems. Therefore, a lot of research about power optimization which provides optimal power supply and body bias voltages has been carried out. However, considering the actual voltage sources, the conventional approaches suffer from limited performance/power control granularity and may lead to degradation in terms of the energy efficiency. Therefore, in this paper, a power optimization method that improves the performance/power control granularity is proposed and evaluated with real processor chips. In the proposed optimization, the body biases for nMOSFET and pMOSFET are controlled independently, while the conventional methods control them uniformly. This increases the number of possible voltage combinations and allows finer target frequency selection leading to lower power consumption than the conventional methods at the cost of the optimization complexity. In order to ease this complexity, the proposed optimization is based on simple power and delay models. The model-based optimization does not require brute force search in the phase of real chip testing; thus, the testing time and cost can be significantly reduced. Since the coefficients of the models are extracted with real chip measurements, the error of the model can be suppressed to a few percent in average. The proposed approach is validated by real chips implemented with a 65-nm fully depleted silicon on insulator technology. The evaluation results show that the proposed optimization is an efficient mean of power reduction for a leakage current dominant chip. In fact, when compared with the conventional method, the proposed approach achieves 9.617% of average power reduction reaching up to 22.77% in the case of the V850 microcontroller.
AB - Body bias control is a fundamental technique widely used to provide an efficient tradeoff between leakage power and performance in ultralow-power systems. Therefore, a lot of research about power optimization which provides optimal power supply and body bias voltages has been carried out. However, considering the actual voltage sources, the conventional approaches suffer from limited performance/power control granularity and may lead to degradation in terms of the energy efficiency. Therefore, in this paper, a power optimization method that improves the performance/power control granularity is proposed and evaluated with real processor chips. In the proposed optimization, the body biases for nMOSFET and pMOSFET are controlled independently, while the conventional methods control them uniformly. This increases the number of possible voltage combinations and allows finer target frequency selection leading to lower power consumption than the conventional methods at the cost of the optimization complexity. In order to ease this complexity, the proposed optimization is based on simple power and delay models. The model-based optimization does not require brute force search in the phase of real chip testing; thus, the testing time and cost can be significantly reduced. Since the coefficients of the models are extracted with real chip measurements, the error of the model can be suppressed to a few percent in average. The proposed approach is validated by real chips implemented with a 65-nm fully depleted silicon on insulator technology. The evaluation results show that the proposed optimization is an efficient mean of power reduction for a leakage current dominant chip. In fact, when compared with the conventional method, the proposed approach achieves 9.617% of average power reduction reaching up to 22.77% in the case of the V850 microcontroller.
KW - Asymmetric body bias control (BBC)
KW - fully depleted silicon on insulator (FD-SOI)
KW - power optimization
KW - ultralow-power design
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U2 - 10.1109/TVLSI.2018.2812893
DO - 10.1109/TVLSI.2018.2812893
M3 - Article
AN - SCOPUS:85044390579
SN - 1063-8210
VL - 26
SP - 1254
EP - 1267
JO - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
JF - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IS - 7
ER -