TY - JOUR
T1 - Automatic film formation system for ultra-thin organic/inorganic hetero-structure by mass-controlled layer-by-layer sequential adsorption method with 'nm' scale accuracy
AU - Shiratori, Seimei S.
AU - Ito, Takahiro
AU - Yamada, Takeshi
N1 - Funding Information:
The authors thank prof. Rubner of Massachusetts Institute of Technology, USA for his kind advice on this study. A part of this work was supported by the financial aid from TEPCO Research Foundation (1999–2000) and Kurata Foundation (1999) in Japan.
PY - 2002/2/18
Y1 - 2002/2/18
N2 - A mass-controlled layer-by-layer sequential adsorption process was newly developed for the fabrication of ultra-thin organic films formed by various polymers, monomers, and inorganic materials. This technique can be applied to both water solutions and volatile solvents. In this process, a quartz crystal microbalance (QCM) was attached to the arm of a robot and the frequency shifts during the adsorption of the materials were monitored. By feeding back the data acquired by the QCM from the deposition to the dipping time, a high quality self-assembly film was produced. As a result, the layer thickness of the films can be controlled with nm-order accuracy. The cross-sectional transmission electron microscopy (TEM) observation of the films formed by the conventional time controlled dipping method and the newly established mass-controlled dipping method reveals that the interface of the hetero structure of the latter was much smoother than the former. The remarkable advantage of the mass-controlled dipping method was also proved by in-situ observation of the adsorption process of the polyelectrolytes in solution using an atomic force microscopy.
AB - A mass-controlled layer-by-layer sequential adsorption process was newly developed for the fabrication of ultra-thin organic films formed by various polymers, monomers, and inorganic materials. This technique can be applied to both water solutions and volatile solvents. In this process, a quartz crystal microbalance (QCM) was attached to the arm of a robot and the frequency shifts during the adsorption of the materials were monitored. By feeding back the data acquired by the QCM from the deposition to the dipping time, a high quality self-assembly film was produced. As a result, the layer thickness of the films can be controlled with nm-order accuracy. The cross-sectional transmission electron microscopy (TEM) observation of the films formed by the conventional time controlled dipping method and the newly established mass-controlled dipping method reveals that the interface of the hetero structure of the latter was much smoother than the former. The remarkable advantage of the mass-controlled dipping method was also proved by in-situ observation of the adsorption process of the polyelectrolytes in solution using an atomic force microscopy.
KW - Layer-by-layer
KW - Mass control
KW - Quartz crystal microbalance
KW - Sequential adsorption
KW - Thin film
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U2 - 10.1016/S0927-7757(01)00953-0
DO - 10.1016/S0927-7757(01)00953-0
M3 - Article
AN - SCOPUS:4344603900
SN - 0927-7757
VL - 198-200
SP - 415
EP - 423
JO - Colloids and Surfaces A: Physicochemical and Engineering Aspects
JF - Colloids and Surfaces A: Physicochemical and Engineering Aspects
ER -