TY - JOUR
T1 - Bayes estimator of process capability index Cpk with a specified prior mean
AU - Matsuura, Shun
N1 - Funding Information:
The author would like to thank anonymous reviewers for their constructive comments. The author would also like to thank Mr. Ryota Hashimoto and Ms. Shiori Takahashi (they graduated from Keio University) for discussions on the estimation problem of process capability indices.
Publisher Copyright:
© 2021 Taylor & Francis Group, LLC.
PY - 2023
Y1 - 2023
N2 - Process capability indices such as Cp, CpL, CpU, and Cpk have been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of Cpk is constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.
AB - Process capability indices such as Cp, CpL, CpU, and Cpk have been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of Cpk is constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.
KW - Bayes estimator
KW - process capability index
KW - statistical quality control
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U2 - 10.1080/03610926.2021.1947508
DO - 10.1080/03610926.2021.1947508
M3 - Article
AN - SCOPUS:85109659005
SN - 0361-0926
VL - 52
SP - 2215
EP - 2227
JO - Communications in Statistics - Theory and Methods
JF - Communications in Statistics - Theory and Methods
IS - 7
ER -