Characteristics of nanostructured Ag films by the reduction of sputtered AgOx thin films

Tomofumi Arai; Carsten Rockstuhl; Paul Fons; Kazuma Kurihara; Takashi Nakano; Koichi Awazu; Junji Tominaga

doi:10.1088/0957-4484/17/1/013

Characteristics of nanostructured Ag films by the reduction of sputtered AgO_x thin films

Tomofumi Arai, Carsten Rockstuhl, Paul Fons, Kazuma Kurihara, Takashi Nakano, Koichi Awazu, Junji Tominaga

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

The fabrication process and the optical properties of nanostructured silver (Ag) films made from silver oxide (AgO_x) thin films have been studied in detail. The formation of Ag nanoparticles with a diameter of about 50 nm during the reduction of AgO_x films was clearly demonstrated by scanning electron microscopy (SEM) and cross-sectional transmission electron microscopy (TEM) observations. The reflectance spectra of the nanostructured Ag films exhibited an intensive localized surface plasmon resonance (LSPR). The transformation in the reflectance spectra with reduction time was in good agreement with computer simulations based on Mie theory. The composition ratio of AgO_x films during the reduction was analysed by the Ag L _III edge x-ray absorption near-edge structure (XANES) measurements.

Original language	English
Pages (from-to)	79-82
Number of pages	4
Journal	Nanotechnology
Volume	17
Issue number	1
DOIs	https://doi.org/10.1088/0957-4484/17/1/013
Publication status	Published - 2006 Jan 14
Externally published	Yes

ASJC Scopus subject areas

Bioengineering
Chemistry(all)
Materials Science(all)
Mechanics of Materials
Mechanical Engineering
Electrical and Electronic Engineering

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abstract = "The fabrication process and the optical properties of nanostructured silver (Ag) films made from silver oxide (AgOx) thin films have been studied in detail. The formation of Ag nanoparticles with a diameter of about 50 nm during the reduction of AgOx films was clearly demonstrated by scanning electron microscopy (SEM) and cross-sectional transmission electron microscopy (TEM) observations. The reflectance spectra of the nanostructured Ag films exhibited an intensive localized surface plasmon resonance (LSPR). The transformation in the reflectance spectra with reduction time was in good agreement with computer simulations based on Mie theory. The composition ratio of AgOx films during the reduction was analysed by the Ag L III edge x-ray absorption near-edge structure (XANES) measurements.",

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AU - Arai, Tomofumi

AU - Rockstuhl, Carsten

AU - Fons, Paul

AU - Kurihara, Kazuma

AU - Nakano, Takashi

AU - Awazu, Koichi

AU - Tominaga, Junji

PY - 2006/1/14

Y1 - 2006/1/14

N2 - The fabrication process and the optical properties of nanostructured silver (Ag) films made from silver oxide (AgOx) thin films have been studied in detail. The formation of Ag nanoparticles with a diameter of about 50 nm during the reduction of AgOx films was clearly demonstrated by scanning electron microscopy (SEM) and cross-sectional transmission electron microscopy (TEM) observations. The reflectance spectra of the nanostructured Ag films exhibited an intensive localized surface plasmon resonance (LSPR). The transformation in the reflectance spectra with reduction time was in good agreement with computer simulations based on Mie theory. The composition ratio of AgOx films during the reduction was analysed by the Ag L III edge x-ray absorption near-edge structure (XANES) measurements.

AB - The fabrication process and the optical properties of nanostructured silver (Ag) films made from silver oxide (AgOx) thin films have been studied in detail. The formation of Ag nanoparticles with a diameter of about 50 nm during the reduction of AgOx films was clearly demonstrated by scanning electron microscopy (SEM) and cross-sectional transmission electron microscopy (TEM) observations. The reflectance spectra of the nanostructured Ag films exhibited an intensive localized surface plasmon resonance (LSPR). The transformation in the reflectance spectra with reduction time was in good agreement with computer simulations based on Mie theory. The composition ratio of AgOx films during the reduction was analysed by the Ag L III edge x-ray absorption near-edge structure (XANES) measurements.

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Characteristics of nanostructured Ag films by the reduction of sputtered AgO_x thin films

Abstract

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