Characterization of CIGS thin films and solar cells grown with a plasma-cracked Se source

Shogo Ishizuka, Akimasa Yamada, Paul Fons, Shigeru Niki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)


The variation observed in rf-plasma cracked radical Se (R-Se) source grown Cu(In, Ga)Se 2 (CIGS) film properties and conventional evaporative Se (E-Se) source grown CIGS film properties was studied for the development of industrial production techniques of evaporated CIGS films and CIGS texture control techniques, which are important for the optimization of the CIGS/buffer layer interface to yield high cell and module efficiencies using various types of buffer layer materials as well as for the study of surface and interface physics of CIGS solar cells. R-Se grown CIGS films exhibit distinctive characteristics such as highly dense surfaces and large grain size in comparison with E-Se grown CIGS films. On the other hand, R-Se grown (In, Ga) 2Se 3 precursor films was similar to E-Se grown films fabricated with the Se to metal flux ratio (P [Se]/[In+Ga]) of around 6, though the nominal P [Se]/[In+Ga] used for a R-Se source was less than 0.5, implying that the use of a R-Se source can demonstrate a significant reduction of the raw material consumption of Se. In the present work, it is shown that the Se source conditions used for the CIGS growth have a variety of important effects on the growth kinetics and concomitant solar cell properties.

Original languageEnglish
Title of host publicationProgram - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011
Number of pages3
Publication statusPublished - 2011
Externally publishedYes
Event37th IEEE Photovoltaic Specialists Conference, PVSC 2011 - Seattle, WA, United States
Duration: 2011 Jun 192011 Jun 24

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371


Other37th IEEE Photovoltaic Specialists Conference, PVSC 2011
Country/TerritoryUnited States
CitySeattle, WA

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering


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