TY - JOUR
T1 - Control of Coulomb blockade oscillations in silicon single electron transistors using silicon nanocrystal floating gates
AU - Takahashi, Nobuyoshi
AU - Ishikuro, Hiroki
AU - Hiramoto, Toshiro
PY - 2000/1/10
Y1 - 2000/1/10
N2 - We have fabricated single-electron transistors (SETs) with Si nanocrystal floating gates, and experimentally demonstrated the control of the peak positions of Coulomb blockade oscillations. The positive voltage applied to the gate makes channel electrons tunnel into the floating dots, and the injected electrons raise the potential of quantum dots in SET, resulting in a shift of peak positions of Coulomb blockade oscillations. In addition, from the temperature dependence of device characteristics, it is confirmed that the potential fluctuations caused by random distribution of the Si nanocrystals have a slight influence on the shape of the Ids-Vg curves at practical high temperatures.
AB - We have fabricated single-electron transistors (SETs) with Si nanocrystal floating gates, and experimentally demonstrated the control of the peak positions of Coulomb blockade oscillations. The positive voltage applied to the gate makes channel electrons tunnel into the floating dots, and the injected electrons raise the potential of quantum dots in SET, resulting in a shift of peak positions of Coulomb blockade oscillations. In addition, from the temperature dependence of device characteristics, it is confirmed that the potential fluctuations caused by random distribution of the Si nanocrystals have a slight influence on the shape of the Ids-Vg curves at practical high temperatures.
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U2 - 10.1063/1.125704
DO - 10.1063/1.125704
M3 - Article
AN - SCOPUS:0001370307
SN - 0003-6951
VL - 76
SP - 209
EP - 211
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 2
ER -