TY - JOUR
T1 - Density measurement for carbon nanotube film grown on flat substrates
AU - Omote, Kazuhiko
AU - Hirose, Raita
AU - Imayama, Naoya
AU - Noda, Kei
AU - Endoh, Ryo
AU - Sugiyama, Naoyuki
N1 - Publisher Copyright:
© 2019 The Japan Society of Applied Physics.
PY - 2020/1/1
Y1 - 2020/1/1
N2 - An X-ray absorption method for measuring the density of vertically aligned carbon nanotube film grown on a flat substrate is proposed. X-rays can penetrate the film parallel to the surface direction, and the transmitted X-rays are detected by an X-ray camera, which enables the film, substrate, and air regions to be distinguished in the observed X-ray image. When the sample surface is aligned just parallel to the penetrating direction of the X-rays, the transmittance of the film can be observed. The film density is calculated from the observed transmittance if the elemental composition of the film material is known.
AB - An X-ray absorption method for measuring the density of vertically aligned carbon nanotube film grown on a flat substrate is proposed. X-rays can penetrate the film parallel to the surface direction, and the transmitted X-rays are detected by an X-ray camera, which enables the film, substrate, and air regions to be distinguished in the observed X-ray image. When the sample surface is aligned just parallel to the penetrating direction of the X-rays, the transmittance of the film can be observed. The film density is calculated from the observed transmittance if the elemental composition of the film material is known.
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U2 - 10.7567/1882-0786/ab5991
DO - 10.7567/1882-0786/ab5991
M3 - Article
AN - SCOPUS:85076766204
SN - 1882-0778
VL - 13
JO - Applied Physics Express
JF - Applied Physics Express
IS - 1
M1 - 016501
ER -