Design and implementation of near-field scanning optical microscope for observation of interfacial liquid crystal orientation

Toshiyasu Tadokoro; Toshiharu Saiki; Hirokazu Toriumi

doi:10.1143/JJAP.41.L152

Design and implementation of near-field scanning optical microscope for observation of interfacial liquid crystal orientation

Toshiyasu Tadokoro, Toshiharu Saiki, Hirokazu Toriumi

Research output: Contribution to journal › Article › peer-review

18 Citations (Scopus)

Abstract

A near-field scanning optical microscope (NSOM), optimized for observation of liquid crystal (LC) orientation at the LC/alignment layer interface, has been developed. The NSOM operates in the illumination mode using a metal-coated optical fiber probe together with a probe-positioning system based on the optical feedback technique. This novel system enables the depth profiling and two-dimensional imaging of the LC orientation distribution under an applied local electric field with high spatial resolution. In this paper we describe the design and implementation of the developed NSOM system and report its first application to the microscopic analysis of LC orientation at the LC/alignment layer interface.

Original language	English
Pages (from-to)	L152-L154
Journal	Japanese Journal of Applied Physics, Part 2: Letters
Volume	41
Issue number	2 A
DOIs	https://doi.org/10.1143/JJAP.41.L152
Publication status	Published - 2002 Feb 1
Externally published	Yes

Keywords

Anchoring effect
Depth profiling
Evanescent field
Liquid crystal
Near-field scanning optical microscope (NSOM)
Orientation
Polarization

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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10.1143/JJAP.41.L152

Cite this

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abstract = "A near-field scanning optical microscope (NSOM), optimized for observation of liquid crystal (LC) orientation at the LC/alignment layer interface, has been developed. The NSOM operates in the illumination mode using a metal-coated optical fiber probe together with a probe-positioning system based on the optical feedback technique. This novel system enables the depth profiling and two-dimensional imaging of the LC orientation distribution under an applied local electric field with high spatial resolution. In this paper we describe the design and implementation of the developed NSOM system and report its first application to the microscopic analysis of LC orientation at the LC/alignment layer interface.",

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AU - Saiki, Toshiharu

AU - Toriumi, Hirokazu

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KW - Depth profiling

KW - Evanescent field

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KW - Orientation

KW - Polarization

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Design and implementation of near-field scanning optical microscope for observation of interfacial liquid crystal orientation

Abstract

Keywords

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