Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field around Micro-Circuit with Diamond Quantum Sensor

Fuki Otsubo; Takumi Mikawa; Yuichiro Matsuzaki; Norio Tokuda; Norikazu Mizuochi; Junko Ishi-Hayase

Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field around Micro-Circuit with Diamond Quantum Sensor

Fuki Otsubo, Takumi Mikawa, Yuichiro Matsuzaki, Norio Tokuda, Norikazu Mizuochi, Junko Ishi-Hayase

Department of Applied Physics and Physico-Informatics

Research output: Contribution to conference › Paper › peer-review

Abstract

Magnetic field distribution is significant information for LSI failure analysis. In this study, we detected continuous change in phase of AC magnetic field as well as amplitude utilizing RF-dressed states of electron spins in diamond.

Original language	English
Publication status	Published - 2024
Event	2024 Conference on Lasers and Electro-Optics/Pacific Rim, CLEO-PR 2024 - Incheon, Korea, Republic of Duration: 2024 Aug 4 → 2024 Aug 8

Conference

Conference	2024 Conference on Lasers and Electro-Optics/Pacific Rim, CLEO-PR 2024
Country/Territory	Korea, Republic of
City	Incheon
Period	24/8/4 → 24/8/8

ASJC Scopus subject areas

Instrumentation
Atomic and Molecular Physics, and Optics

Cite this

Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field around Micro-Circuit with Diamond Quantum Sensor. / Otsubo, Fuki; Mikawa, Takumi; Matsuzaki, Yuichiro et al.
2024. Paper presented at 2024 Conference on Lasers and Electro-Optics/Pacific Rim, CLEO-PR 2024, Incheon, Korea, Republic of.

Research output: Contribution to conference › Paper › peer-review

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title = "Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field around Micro-Circuit with Diamond Quantum Sensor",

abstract = "Magnetic field distribution is significant information for LSI failure analysis. In this study, we detected continuous change in phase of AC magnetic field as well as amplitude utilizing RF-dressed states of electron spins in diamond.",

author = "Fuki Otsubo and Takumi Mikawa and Yuichiro Matsuzaki and Norio Tokuda and Norikazu Mizuochi and Junko Ishi-Hayase",

note = "Publisher Copyright: {\textcopyright} 2024 The Author(s); 2024 Conference on Lasers and Electro-Optics/Pacific Rim, CLEO-PR 2024 ; Conference date: 04-08-2024 Through 08-08-2024",

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T1 - Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field around Micro-Circuit with Diamond Quantum Sensor

AU - Otsubo, Fuki

AU - Mikawa, Takumi

AU - Matsuzaki, Yuichiro

AU - Tokuda, Norio

AU - Mizuochi, Norikazu

AU - Ishi-Hayase, Junko

PY - 2024

Y1 - 2024

N2 - Magnetic field distribution is significant information for LSI failure analysis. In this study, we detected continuous change in phase of AC magnetic field as well as amplitude utilizing RF-dressed states of electron spins in diamond.

AB - Magnetic field distribution is significant information for LSI failure analysis. In this study, we detected continuous change in phase of AC magnetic field as well as amplitude utilizing RF-dressed states of electron spins in diamond.

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M3 - Paper

AN - SCOPUS:85216096008

T2 - 2024 Conference on Lasers and Electro-Optics/Pacific Rim, CLEO-PR 2024

Y2 - 4 August 2024 through 8 August 2024

ER -

Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field around Micro-Circuit with Diamond Quantum Sensor

Abstract

Conference

ASJC Scopus subject areas

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