Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field Around Micro-Circuit with Diamond Quantum Sensor

Fuki Otsubo; Takumi Mikawa; Yuichiro Matsuzaki; Norio Tokuda; Norikazu Mizuochi; Junko Ishi-Hayase

doi:10.1109/CLEO-PR60912.2024.10676628

Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field Around Micro-Circuit with Diamond Quantum Sensor

Fuki Otsubo
, Takumi Mikawa
, Yuichiro Matsuzaki
, Norio Tokuda
, Norikazu Mizuochi
, Junko Ishi-Hayase

Department of Applied Physics and Physico-Informatics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Magnetic field distribution is significant information for LSI failure analysis. In this study, we detected continuous change in phase of AC magnetic field as well as amplitude utilizing RF -dressed states of electron spins in diamond.

Original language	English
Title of host publication	16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9798350372076
DOIs	https://doi.org/10.1109/CLEO-PR60912.2024.10676628
Publication status	Published - 2024
Event	16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024 - Incheon, Korea, Republic of Duration: 2024 Aug 4 → 2024 Aug 9

Publication series

Name	16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024

Conference

Conference	16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024
Country/Territory	Korea, Republic of
City	Incheon
Period	24/8/4 → 24/8/9

ASJC Scopus subject areas

Instrumentation
Atomic and Molecular Physics, and Optics

Access to Document

10.1109/CLEO-PR60912.2024.10676628

Cite this

Otsubo, F., Mikawa, T., Matsuzaki, Y., Tokuda, N., Mizuochi, N., & Ishi-Hayase, J. (2024). Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field Around Micro-Circuit with Diamond Quantum Sensor. In 16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024 (16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEO-PR60912.2024.10676628

Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field Around Micro-Circuit with Diamond Quantum Sensor. / Otsubo, Fuki; Mikawa, Takumi; Matsuzaki, Yuichiro et al.
16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024. Institute of Electrical and Electronics Engineers Inc., 2024. (16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Otsubo, F, Mikawa, T, Matsuzaki, Y, Tokuda, N, Mizuochi, N & Ishi-Hayase, J 2024, Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field Around Micro-Circuit with Diamond Quantum Sensor. in 16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024. 16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024, Institute of Electrical and Electronics Engineers Inc., 16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024, Incheon, Korea, Republic of, 24/8/4. https://doi.org/10.1109/CLEO-PR60912.2024.10676628

Otsubo F, Mikawa T, Matsuzaki Y, Tokuda N, Mizuochi N, Ishi-Hayase J. Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field Around Micro-Circuit with Diamond Quantum Sensor. In 16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024. Institute of Electrical and Electronics Engineers Inc. 2024. (16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024). doi: 10.1109/CLEO-PR60912.2024.10676628

Otsubo, Fuki ; Mikawa, Takumi ; Matsuzaki, Yuichiro et al. / Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field Around Micro-Circuit with Diamond Quantum Sensor. 16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024. Institute of Electrical and Electronics Engineers Inc., 2024. (16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024).

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abstract = "Magnetic field distribution is significant information for LSI failure analysis. In this study, we detected continuous change in phase of AC magnetic field as well as amplitude utilizing RF -dressed states of electron spins in diamond.",

author = "Fuki Otsubo and Takumi Mikawa and Yuichiro Matsuzaki and Norio Tokuda and Norikazu Mizuochi and Junko Ishi-Hayase",

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Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field Around Micro-Circuit with Diamond Quantum Sensor

Abstract

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