Determination of the composition of strained tetragonal epilayers

P. Fons; D. J. Bottomley; D. J. Tweet; S. Niki; A. Yamada

doi:10.1063/1.117883

Determination of the composition of strained tetragonal epilayers

P. Fons, D. J. Bottomley, D. J. Tweet, S. Niki, A. Yamada

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

Elasticity theory is applied to calculate the total strain present in a tetragonal symmetry epilayer due to heteroepitaxial misfit. By relating pseudobinary alloy composition to the lattice constants of the epilayer, it is shown that the composition of a pseudobinary epilayer can be determined from measurement of the strained epilayer lattice constants. This is accomplished by expressing the misfit strain in terms of the composition and the individual lattice constants of the component of the epilayer and using Vegard's rule. As a result, determination of the composition of two chalcopyrite symmetry epilayers from x-ray diffraction measurements is demonstrated. The approach presented here is general and can be applied to any substrate-epilayer combination in the elastic limit.

Original language	English
Pages (from-to)	761-763
Number of pages	3
Journal	Applied Physics Letters
Volume	69
Issue number	6
DOIs	https://doi.org/10.1063/1.117883
Publication status	Published - 1996 Aug 5
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.117883

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title = "Determination of the composition of strained tetragonal epilayers",

abstract = "Elasticity theory is applied to calculate the total strain present in a tetragonal symmetry epilayer due to heteroepitaxial misfit. By relating pseudobinary alloy composition to the lattice constants of the epilayer, it is shown that the composition of a pseudobinary epilayer can be determined from measurement of the strained epilayer lattice constants. This is accomplished by expressing the misfit strain in terms of the composition and the individual lattice constants of the component of the epilayer and using Vegard's rule. As a result, determination of the composition of two chalcopyrite symmetry epilayers from x-ray diffraction measurements is demonstrated. The approach presented here is general and can be applied to any substrate-epilayer combination in the elastic limit.",

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T1 - Determination of the composition of strained tetragonal epilayers

AU - Fons, P.

AU - Bottomley, D. J.

AU - Tweet, D. J.

AU - Niki, S.

AU - Yamada, A.

PY - 1996/8/5

Y1 - 1996/8/5

N2 - Elasticity theory is applied to calculate the total strain present in a tetragonal symmetry epilayer due to heteroepitaxial misfit. By relating pseudobinary alloy composition to the lattice constants of the epilayer, it is shown that the composition of a pseudobinary epilayer can be determined from measurement of the strained epilayer lattice constants. This is accomplished by expressing the misfit strain in terms of the composition and the individual lattice constants of the component of the epilayer and using Vegard's rule. As a result, determination of the composition of two chalcopyrite symmetry epilayers from x-ray diffraction measurements is demonstrated. The approach presented here is general and can be applied to any substrate-epilayer combination in the elastic limit.

AB - Elasticity theory is applied to calculate the total strain present in a tetragonal symmetry epilayer due to heteroepitaxial misfit. By relating pseudobinary alloy composition to the lattice constants of the epilayer, it is shown that the composition of a pseudobinary epilayer can be determined from measurement of the strained epilayer lattice constants. This is accomplished by expressing the misfit strain in terms of the composition and the individual lattice constants of the component of the epilayer and using Vegard's rule. As a result, determination of the composition of two chalcopyrite symmetry epilayers from x-ray diffraction measurements is demonstrated. The approach presented here is general and can be applied to any substrate-epilayer combination in the elastic limit.

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Determination of the composition of strained tetragonal epilayers

Abstract

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