Development of a low temperature scanning probe microscope

Kohta Saitoh, Kenichi Hayashi, Yoshiyuki Shibayama, Keiya Shirahama

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)


A scanning probe microscope working at low temperatures is developed. Frequency-modulation atomic force microscopy technique with a quartz tuning fork is employed for low temperatures use. Topographic imaging of a diffraction grating is successfully performed down to 1.3 K.

Original languageEnglish
Pages (from-to)561-566
Number of pages6
JournalJournal of Low Temperature Physics
Issue number3-4
Publication statusPublished - 2008 Feb


  • Low temperature instrumentation and new techniques

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • General Materials Science
  • Condensed Matter Physics


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