TY - JOUR
T1 - Direct observation of local magnetic field generated by micromagnet
AU - Watanabe, Shinji
AU - Sasaki, Susumu
AU - Sato, Shinya
AU - Isogai, Naoki
AU - Matsumoto, Yoshinori
N1 - Funding Information:
S.S. and Y.M. were supported by Japan Science and Technology Corporation, and also by Grant-in-Aid for Scientific Research (C) 19540362.
PY - 2008
Y1 - 2008
N2 - Using standard nuclear magnetic resonance (NMR) technique and a well-fabricated sample, we have succeeded in directly observing local magnetic field generated by a micromagnet Ni45 Fe55 (with thickness of 400 nm), which was sputtered on an Al layer of 20 nm thickness. Improved sensitivity of our NMR technique enabled us to clearly observe Al-NMR signals, which are confirmed to come from Al nuclei in the 20 nm layers. From the analysis of the Al-NMR spectra, the local magnetic field was found to be +0.17±0.02 (-0.20±0.01) T, the sign of which is consistent with the geometry that the external magnetic field was applied perpendicular (parallel) to the Al layer. The present study gives a potential key element toward realizing higher resolution in magnetic resonance imaging.
AB - Using standard nuclear magnetic resonance (NMR) technique and a well-fabricated sample, we have succeeded in directly observing local magnetic field generated by a micromagnet Ni45 Fe55 (with thickness of 400 nm), which was sputtered on an Al layer of 20 nm thickness. Improved sensitivity of our NMR technique enabled us to clearly observe Al-NMR signals, which are confirmed to come from Al nuclei in the 20 nm layers. From the analysis of the Al-NMR spectra, the local magnetic field was found to be +0.17±0.02 (-0.20±0.01) T, the sign of which is consistent with the geometry that the external magnetic field was applied perpendicular (parallel) to the Al layer. The present study gives a potential key element toward realizing higher resolution in magnetic resonance imaging.
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U2 - 10.1063/1.2944144
DO - 10.1063/1.2944144
M3 - Article
AN - SCOPUS:46049092572
SN - 0003-6951
VL - 92
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 25
M1 - 253116
ER -