Abstract
Distortion of laser-induced fluorescence (LIF) spectral line profile of trapped ions in an rf trap is observed and analyzed. It is found by establishing a theoretical model that collisions and laser radiation pressure induce the distortion. Furthermore, a new type line profile predicted by this model is observed.
| Original language | English |
|---|---|
| Pages (from-to) | 335-336 |
| Number of pages | 2 |
| Journal | CPEM Digest (Conference on Precision Electromagnetic Measurements) |
| Publication status | Published - 1998 Dec 1 |
| Externally published | Yes |
| Event | Proceedings of the 1998 Conference Precision Electromagnetic Measurements - Washington, DC, USA Duration: 1998 Jul 6 → 1998 Jul 10 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Instrumentation
- Electrical and Electronic Engineering