TY - GEN
T1 - Dual-probe scanning near-field optical microscopy (DSNOM) utilizing ultrafast plasmon nano-focusing
AU - Kojima, Yasuhiro
AU - Masaki, Yuta
AU - Kannari, Fumihiko
PY - 2016/12/16
Y1 - 2016/12/16
N2 - Dual-probe scanning near-field optical microscopy combining spectral interferometry (SI-DSNOM) which utilizes ultrafast surface-plasmon polariton nanofocusing as excitation light is constructed and experimentally demonstrated. We achieve spatiotemporal resolution of 100 nm and 10 fs.
AB - Dual-probe scanning near-field optical microscopy combining spectral interferometry (SI-DSNOM) which utilizes ultrafast surface-plasmon polariton nanofocusing as excitation light is constructed and experimentally demonstrated. We achieve spatiotemporal resolution of 100 nm and 10 fs.
UR - http://www.scopus.com/inward/record.url?scp=85010677076&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85010677076&partnerID=8YFLogxK
U2 - 10.1364/cleo_at.2016.jtu5a.68
DO - 10.1364/cleo_at.2016.jtu5a.68
M3 - Conference contribution
AN - SCOPUS:85010677076
T3 - 2016 Conference on Lasers and Electro-Optics, CLEO 2016
BT - 2016 Conference on Lasers and Electro-Optics, CLEO 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 Conference on Lasers and Electro-Optics, CLEO 2016
Y2 - 5 June 2016 through 10 June 2016
ER -