TY - GEN
T1 - Effect of intermetallic compound layer development on interfacial strength of solder joints
AU - Omiya, Masaki
AU - Kishimoto, Kikuo
AU - Shibuya, Toshikazu
AU - Amagai, Masazumi
PY - 2001/12/1
Y1 - 2001/12/1
N2 - Recently, preventing environmental pollutions, lead-free (Pb-free) solders are widely used instead of conventional lead-tin(Pb-Sn) eutectic solders. However, the mechanical properties of Pb-free solders have not been clarified. Intermetallic compounds are formed during reflow process between solder and electrical pads and gradually grow in service. Due to it's brittle manner, the reliability of solder joints are supposed to degenerate. By using the Cu-plates on which Cu or Ni or Ni+Au plating was deposited, and Pb-free solders (Sn-Ag-Cu solders), the specimen of solder joints were fabricated. After aging it in an isothermal chamber, tensile tests were performed and the relations between solder joint strength and aging period were considered. From SEM microscope observation and EDX microprobe analysis, the growth and components of the intermetallic compounds layer were also examined.
AB - Recently, preventing environmental pollutions, lead-free (Pb-free) solders are widely used instead of conventional lead-tin(Pb-Sn) eutectic solders. However, the mechanical properties of Pb-free solders have not been clarified. Intermetallic compounds are formed during reflow process between solder and electrical pads and gradually grow in service. Due to it's brittle manner, the reliability of solder joints are supposed to degenerate. By using the Cu-plates on which Cu or Ni or Ni+Au plating was deposited, and Pb-free solders (Sn-Ag-Cu solders), the specimen of solder joints were fabricated. After aging it in an isothermal chamber, tensile tests were performed and the relations between solder joint strength and aging period were considered. From SEM microscope observation and EDX microprobe analysis, the growth and components of the intermetallic compounds layer were also examined.
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M3 - Conference contribution
AN - SCOPUS:0347569301
SN - 0791835405
T3 - Advances in Electronic Packaging
SP - 1157
EP - 1164
BT - Advances in Electronic Packaging; Thermal Manegement Reliability
T2 - Pacific Rim/International , Intersociety Electronic Packaging Technical/Business Conference and Exhibition
Y2 - 8 July 2001 through 13 July 2001
ER -