TY - GEN
T1 - Electron transport through tetrahedral-shaped recess (TSR) stacked double quantum dot structures
AU - Shima, M.
AU - Sakuma, Y.
AU - Wirner, C.
AU - Strutz, T.
AU - Taguchi, E.
AU - Futatsugi, T.
AU - Awano, Y.
AU - Yokoyama, N.
N1 - Funding Information:
This work was performed under the management of FED as a part of the MITI R&D propam (Quantum Functional Devices project) supported by NEDO. The authors would like to thank Dr. Takatsu from Fujitsu Laboratories Ltd. for his discussions.
Publisher Copyright:
© 1998 IEEE.
PY - 1997
Y1 - 1997
N2 - We formed a stacked double TSR quantum dot structure and measured its I-V characteristics. The fine structure related to TSR quantum dots was observed in the low bias region, while negative differential resistances on the order of μA were observed in the higher bias region. The fine structure is well explained by the resonant tunneling through individual TSR quantum dot states.
AB - We formed a stacked double TSR quantum dot structure and measured its I-V characteristics. The fine structure related to TSR quantum dots was observed in the low bias region, while negative differential resistances on the order of μA were observed in the higher bias region. The fine structure is well explained by the resonant tunneling through individual TSR quantum dot states.
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U2 - 10.1109/ISCS.1998.711734
DO - 10.1109/ISCS.1998.711734
M3 - Conference contribution
AN - SCOPUS:0344986276
SN - 0780338839
SN - 9780780338838
T3 - Proceedings of the IEEE 24th International Symposium on Compound Semiconductors, ISCS 1997
SP - 539
EP - 542
BT - Proceedings of the IEEE 24th International Symposium on Compound Semiconductors, ISCS 1997
A2 - Melloch, Mike
A2 - Reed, Mark A.
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 24th IEEE International Symposium on Compound Semiconductors, ISCS 1997
Y2 - 8 September 1997 through 11 September 1997
ER -