Energy-dispersed near-edge xray absorption fine structure: A new technique to study dynamic surface processes

H. Kondoh; K. Amemiya; I. Nakai; M. Nagasaka; A. Nambu; T. Shimada; T. Yokoyama; T. Ohta

doi:10.1238/Physica.Topical.115a00088

Energy-dispersed near-edge xray absorption fine structure: A new technique to study dynamic surface processes

H. Kondoh, K. Amemiya, I. Nakai, M. Nagasaka, A. Nambu, T. Shimada, T. Yokoyama, T. Ohta

Research output: Contribution to journal › Conference article › peer-review

1 Citation (Scopus)

Abstract

We have recently developed a new type of near-edge x-ray absorption fine structure (NEXAFS) technique, "dispersive-NEXAFS" by using energy-dispersed x-rays and a position-sensitive electron-energy analyzer. With this technique a NEXAFS spectrum is taken in a one-shot manner without scanning photon energy resulting in a typical data acquisition time of several tens seconds. This enables to monitor the dynamic surface processes such as film growth and surface reaction. As examples of such applications, we present kinetics studies of catalytic oxidation reactions on the platinum (111) surfaces. Future possible improvements of this technique are also addressed.

Original language	English
Pages (from-to)	88-92
Number of pages	5
Journal	Physica Scripta T
Volume	T115
DOIs	https://doi.org/10.1238/Physica.Topical.115a00088
Publication status	Published - 2005
Externally published	Yes
Event	12th X-ray Absorption Fine Structure International Conference, XAFS12 - Malmo, Sweden Duration: 2003 Jun 23 → 2003 Jun 27

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Mathematical Physics
Condensed Matter Physics

Access to Document

10.1238/Physica.Topical.115a00088

Cite this

@article{3d83895fc54c4ccd9fca450e64c0d150,

title = "Energy-dispersed near-edge xray absorption fine structure: A new technique to study dynamic surface processes",

abstract = "We have recently developed a new type of near-edge x-ray absorption fine structure (NEXAFS) technique, {"}dispersive-NEXAFS{"} by using energy-dispersed x-rays and a position-sensitive electron-energy analyzer. With this technique a NEXAFS spectrum is taken in a one-shot manner without scanning photon energy resulting in a typical data acquisition time of several tens seconds. This enables to monitor the dynamic surface processes such as film growth and surface reaction. As examples of such applications, we present kinetics studies of catalytic oxidation reactions on the platinum (111) surfaces. Future possible improvements of this technique are also addressed.",

author = "H. Kondoh and K. Amemiya and I. Nakai and M. Nagasaka and A. Nambu and T. Shimada and T. Yokoyama and T. Ohta",

year = "2005",

doi = "10.1238/Physica.Topical.115a00088",

language = "English",

volume = "T115",

pages = "88--92",

journal = "Physica Scripta T",

issn = "0281-1847",

publisher = "IOP Publishing Ltd.",

note = "12th X-ray Absorption Fine Structure International Conference, XAFS12 ; Conference date: 23-06-2003 Through 27-06-2003",

}

TY - JOUR

T1 - Energy-dispersed near-edge xray absorption fine structure

T2 - 12th X-ray Absorption Fine Structure International Conference, XAFS12

AU - Kondoh, H.

AU - Amemiya, K.

AU - Nakai, I.

AU - Nagasaka, M.

AU - Nambu, A.

AU - Shimada, T.

AU - Yokoyama, T.

AU - Ohta, T.

PY - 2005

Y1 - 2005

N2 - We have recently developed a new type of near-edge x-ray absorption fine structure (NEXAFS) technique, "dispersive-NEXAFS" by using energy-dispersed x-rays and a position-sensitive electron-energy analyzer. With this technique a NEXAFS spectrum is taken in a one-shot manner without scanning photon energy resulting in a typical data acquisition time of several tens seconds. This enables to monitor the dynamic surface processes such as film growth and surface reaction. As examples of such applications, we present kinetics studies of catalytic oxidation reactions on the platinum (111) surfaces. Future possible improvements of this technique are also addressed.

AB - We have recently developed a new type of near-edge x-ray absorption fine structure (NEXAFS) technique, "dispersive-NEXAFS" by using energy-dispersed x-rays and a position-sensitive electron-energy analyzer. With this technique a NEXAFS spectrum is taken in a one-shot manner without scanning photon energy resulting in a typical data acquisition time of several tens seconds. This enables to monitor the dynamic surface processes such as film growth and surface reaction. As examples of such applications, we present kinetics studies of catalytic oxidation reactions on the platinum (111) surfaces. Future possible improvements of this technique are also addressed.

UR - http://www.scopus.com/inward/record.url?scp=42149171172&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=42149171172&partnerID=8YFLogxK

U2 - 10.1238/Physica.Topical.115a00088

DO - 10.1238/Physica.Topical.115a00088

M3 - Conference article

AN - SCOPUS:42149171172

SN - 0281-1847

VL - T115

SP - 88

EP - 92

JO - Physica Scripta T

JF - Physica Scripta T

Y2 - 23 June 2003 through 27 June 2003

ER -

Energy-dispersed near-edge xray absorption fine structure: A new technique to study dynamic surface processes

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this