TY - JOUR
T1 - Energy dispersive near edge X-ray absorption fine structure in the soft X-ray region
T2 - A new technique to investigate surface reactions
AU - Amemiya, K.
AU - Kondoh, H.
AU - Nambu, A.
AU - Iwasaki, M.
AU - Nakai, I.
AU - Yokoyama, T.
AU - Ohta, T.
PY - 2001/7/15
Y1 - 2001/7/15
N2 - A novel technique, energy dispersive near edge X-ray absorption tine structure (NEXAFS) spectroscopy, has been successfully developed by using a position sensitive electron analyzer and a new soft X-ray beamline constructed at the bending magnet in the Photon Factory. It was revealed that the NEXAFS spectra can be obtained even for submonolayer adsorbates with an accumulation period of ∼ 30 s. As the first application of the new technique, coverage dependence of C-K-edge NEXAFS spectra were recorded in situ for thiophene adsorption on Au(111).
AB - A novel technique, energy dispersive near edge X-ray absorption tine structure (NEXAFS) spectroscopy, has been successfully developed by using a position sensitive electron analyzer and a new soft X-ray beamline constructed at the bending magnet in the Photon Factory. It was revealed that the NEXAFS spectra can be obtained even for submonolayer adsorbates with an accumulation period of ∼ 30 s. As the first application of the new technique, coverage dependence of C-K-edge NEXAFS spectra were recorded in situ for thiophene adsorption on Au(111).
KW - Energy dispersive method
KW - NEXAFS
KW - Soft X-ray
KW - Surface chemical reaction
KW - Thiophene
UR - http://www.scopus.com/inward/record.url?scp=0035878264&partnerID=8YFLogxK
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U2 - 10.1143/jjap.40.l718
DO - 10.1143/jjap.40.l718
M3 - Article
AN - SCOPUS:0035878264
SN - 0021-4922
VL - 40
SP - L718-L720
JO - Japanese Journal of Applied Physics, Part 2: Letters
JF - Japanese Journal of Applied Physics, Part 2: Letters
IS - 7 B
ER -