Experimental study of two-terminal resistive random access memory realized in mono- and multilayer exfoliated graphene nanoribbons

Aya Shindome, Yu Doioka, Nobuyasu Beppu, Shunri Oda, Ken Uchida

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Two-terminal mono- and multilayer graphene nanoribbon resistive random access memories (ReRAMs) are experimentally demonstrated. Fundamental ReRAM properties, device scalability, and width dependence with device scaling are investigated. The lower switching energy is obtained for smaller channel width, indicating the suitability of graphene nanoribbons for high-density LSIs. Operation mechanism is studied by changing the type of contact metal and the number of graphene layers as well as by performing physical analysis by atomic force microscopy (AFM), cross-sectional transmission electron microscopy (TEM), and electron energy-loss spectroscopy (EELS). Then, it is suggested that the mechanism is the chemical bonding-state change of graphene.

Original languageEnglish
Article number04CN05
JournalJapanese journal of applied physics
Volume52
Issue number4 PART 2
DOIs
Publication statusPublished - 2013 Apr
Externally publishedYes

ASJC Scopus subject areas

  • General Engineering
  • General Physics and Astronomy

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