Abstract
We propose a method to fabricate a novel triple tapered probe for highly sensitive and highly resolved near-field optical microscopy in a near ultraviolet region. The method is based on selective etching of a multistep index fiber. The obtained fiber probe has a triple tapered structure with three taper angles of 60°, 120°, and 60°. With near-field optical microscopy employing the probe, we succeeded in obtaining a photoluminescence image of polysilanes excited by an ultraviolet laser with a wavelength of 351 nm.
Original language | English |
---|---|
Pages (from-to) | 45-48 |
Number of pages | 4 |
Journal | Optics Communications |
Volume | 146 |
Issue number | 1-6 |
DOIs | |
Publication status | Published - 1998 Jan 15 |
Externally published | Yes |
Keywords
- Buffered hydrogen fluoride solution
- Near-field optics
- Optical fiber
- Scanning probe microscopy
- Selective etching
- Ultraviolet spectroscopy
- Vapor-phase axial deposition
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Physical and Theoretical Chemistry
- Electrical and Electronic Engineering