Far-field and near-field optical readings of under-50 nm-sized pits

Sumio Hosaka; Toshimichi Shintani; Hajime Koyanagi; Keizo Katoh; Tetsuya Nishida; Toshiharu Saiki; Tsuyoshi Hasegawa

doi:10.1143/jjap.41.l884

Far-field and near-field optical readings of under-50 nm-sized pits

Sumio Hosaka, Toshimichi Shintani, Hajime Koyanagi, Keizo Katoh, Tetsuya Nishida, Toshiharu Saiki, Tsuyoshi Hasegawa

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

In this study, we investigated the limitations of optical reading of very fine pits using conventional optics, immersion lens optics and near-field optics. Using very fine pits < 100 nm in size formed by electron beam writing, a reflection-type depolarization scanning near-field optical microscope (SNOM) read very fine pits < 50nm in size. On the other hand, far-field optics read fine pits only > 160 nm in size using a lens with a numerical aperture (NA) of 0.95 (17 Gb/in²). In addition, an oil immersion lens optics with a NA of 1.4 read fine pits only 100 nm in size (45 Gb/in²). Advanced near-field optics is a promising tool for achieving ultrahigh-density optical reading of trillion bits/in².

Original language	English
Pages (from-to)	L884-L886
Journal	Japanese Journal of Applied Physics, Part 2: Letters
Volume	41
Issue number	8 A
DOIs	https://doi.org/10.1143/jjap.41.l884
Publication status	Published - 2002 Aug 1
Externally published	Yes

Keywords

Depolarization
Near-field optical reading
Near-field optics
SIL
SNOM
Tera-bit storage

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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10.1143/jjap.41.l884

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title = "Far-field and near-field optical readings of under-50 nm-sized pits",

abstract = "In this study, we investigated the limitations of optical reading of very fine pits using conventional optics, immersion lens optics and near-field optics. Using very fine pits < 100 nm in size formed by electron beam writing, a reflection-type depolarization scanning near-field optical microscope (SNOM) read very fine pits < 50nm in size. On the other hand, far-field optics read fine pits only > 160 nm in size using a lens with a numerical aperture (NA) of 0.95 (17 Gb/in2). In addition, an oil immersion lens optics with a NA of 1.4 read fine pits only 100 nm in size (45 Gb/in2). Advanced near-field optics is a promising tool for achieving ultrahigh-density optical reading of trillion bits/in2.",

keywords = "Depolarization, Near-field optical reading, Near-field optics, SIL, SNOM, Tera-bit storage",

author = "Sumio Hosaka and Toshimichi Shintani and Hajime Koyanagi and Keizo Katoh and Tetsuya Nishida and Toshiharu Saiki and Tsuyoshi Hasegawa",

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AU - Hosaka, Sumio

AU - Shintani, Toshimichi

AU - Koyanagi, Hajime

AU - Katoh, Keizo

AU - Nishida, Tetsuya

AU - Saiki, Toshiharu

AU - Hasegawa, Tsuyoshi

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N2 - In this study, we investigated the limitations of optical reading of very fine pits using conventional optics, immersion lens optics and near-field optics. Using very fine pits < 100 nm in size formed by electron beam writing, a reflection-type depolarization scanning near-field optical microscope (SNOM) read very fine pits < 50nm in size. On the other hand, far-field optics read fine pits only > 160 nm in size using a lens with a numerical aperture (NA) of 0.95 (17 Gb/in2). In addition, an oil immersion lens optics with a NA of 1.4 read fine pits only 100 nm in size (45 Gb/in2). Advanced near-field optics is a promising tool for achieving ultrahigh-density optical reading of trillion bits/in2.

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KW - Depolarization

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KW - SNOM

KW - Tera-bit storage

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Far-field and near-field optical readings of under-50 nm-sized pits

Abstract

Keywords

ASJC Scopus subject areas

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