Fault Localization in Server-Side Applications Using Spectrum-Based Fault Localization

Yoshitomo Sha, Masataka Nagura, Shingo Takada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Today's software has a very complex structure with multiple components, making it difficult to identify the cause of a fault. The process of identifying the cause of a fault may include referring to the logs from the system if they exist. But large and complex systems may generate a huge amount of logs, making the task of finding the important log messages to be a tedious task. In the case of systems that require continuous operation, the cause of faults must be identified quickly in an efficient manner. In this paper, we propose a method that identifies the log messages that are key for finding faults in server-side applications that has a tiered structure, such as LAMP (Linux, Apache, MySQL, PHP), and outputs logs (including traces during operation). The key part of our proposed approach is the application of Spectrum-Based Fault Localization (SBFL) to log files.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1139-1146
Number of pages8
ISBN (Electronic)9781665437868
DOIs
Publication statusPublished - 2022
Event29th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2022 - Virtual, Online, United States
Duration: 2022 Mar 152022 Mar 18

Publication series

NameProceedings - 2022 IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2022

Conference

Conference29th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2022
Country/TerritoryUnited States
CityVirtual, Online
Period22/3/1522/3/18

Keywords

  • Fault localization
  • LAMP
  • Log analysis

ASJC Scopus subject areas

  • Software
  • Safety, Risk, Reliability and Quality

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