TY - JOUR
T1 - First-principles calculations on atomic and electronic structures of misfit dislocations in InAs/GaAs(1 1 0) and GaAs/InAs(1 1 0) heteroepitaxies
AU - Oyama, Norihisa
AU - Ohta, Eiji
AU - Takeda, Kyozaburo
AU - Shiraishi, Kenji
AU - Yamaguchi, Hiroshi
N1 - Funding Information:
This work was partly supported by the High-tech Research Center Project, the Ministry of Education, Science, Sports and Culture of Japan, and JSPS Research for Future Programs in the Area of Atomic Scale Surface and Interface Dynamics.
PY - 1999/5
Y1 - 1999/5
N2 - We investigated the atomic and electronic structures of the misfit dislocations of InAs/GaAs(1 1 0) and GaAs/InAs(1 1 0) heterointerfaces by first-principles calculations and scanning tunneling microscopy tSTM). The calculated results show that the core confined at the InAs/GaAs(1 1 0) heterointerface has five-fold coordinated In atoms. The surface just above the dislocation line was depressed and the calculated vertical displacement was about 0.52 angstroms when the InAs epilayer thickness is 4 ML, which is in good agreement with the STM observations. In the GaAs/InAs heteroepitaxy, core structures drastically change with the increase of GaAs epilayer thickness.
AB - We investigated the atomic and electronic structures of the misfit dislocations of InAs/GaAs(1 1 0) and GaAs/InAs(1 1 0) heterointerfaces by first-principles calculations and scanning tunneling microscopy tSTM). The calculated results show that the core confined at the InAs/GaAs(1 1 0) heterointerface has five-fold coordinated In atoms. The surface just above the dislocation line was depressed and the calculated vertical displacement was about 0.52 angstroms when the InAs epilayer thickness is 4 ML, which is in good agreement with the STM observations. In the GaAs/InAs heteroepitaxy, core structures drastically change with the increase of GaAs epilayer thickness.
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U2 - 10.1016/S0022-0248(98)01333-5
DO - 10.1016/S0022-0248(98)01333-5
M3 - Conference article
AN - SCOPUS:0032643180
SN - 0022-0248
VL - 201
SP - 256
EP - 259
JO - Journal of Crystal Growth
JF - Journal of Crystal Growth
T2 - Proceedings of the 1998 10th International Conference on Molecular Beam Epitaxy (MBE-X)
Y2 - 31 August 1998 through 4 September 1998
ER -