Kobayashi, K
, Tsuda, H, Nishikawa, K, Boyraz, O, Furuta, H, Izutsu, M, Kawanishi, S, Kawashima, H, Makita, K, Nakazawa, M, Stubkjakr, KE, Tsuji, S, Uenohara, H, Weiner, AM, Ming, CWU, Honjo, K, Itoh, Y, Nakayama, M, Nishlmoto, M, Ra, JW, Sanada, A, Seeds, AJ, Asai, T, Fujimoto, R, Fujishima, M, Iwai, H, Won-Seong, LEE, Masu, K, Matsuoka, T, De Meyer, K, Sano, E, Shiojima, K, Ueda, D, Watanabe, M, Yaegassi, S, Esashi, M, Shikida, M, Toshiyoshi, H, Kawai, T, Yoshikawa, N, Yamamoto, S, Ktkuchi, H, Taguchi, A, Takashimia, K & Yamamoto, G 2008, '
From Editor-in-Chief',
IEICE Electronics Express, vol. 5, no. 7, pp. i-iii.