Abstract
We report molecular beam epitaxy (MBE) growth of silicon isotope superlattices (SLs) composed of alternating layers of isotopically enriched 28Si and 30Si. In this work, we have prepared short-period 28Sin/30Sin isotope SLs, where n is the number of atomic monolayer, with n = 1, 2, 3, 4, and 7. Zone-folded optical phonon frequencies due to artificial mass periodicity in the growth direction have been observed by Raman spectroscopy. We have used planar bond-charge model to calculate the frequencies. We found that the frequencies of the observed Raman shift agree well with those of optical phonon modes calculated for each SL structure. A detailed analysis revealed that the degree of intermixing between adjacent layers for our condition is approximately two monolayers.
Original language | English |
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Pages (from-to) | 160-162 |
Number of pages | 3 |
Journal | Thin Solid Films |
Volume | 508 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 2006 Jun 5 |
Keywords
- Molecular beam epitaxy
- Raman scattering
- Silicon
- Superlattices
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry