ICA-based positive semidefinite matrix templates for eye-blink artifact removal from EEG signal with single-electrode

Suguru Kanoga, Yasue Mitsukura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Complete artifact removal of eye-blink for electroencephalographic (EEG) signal is generally-regarded as important process in EEG signal analysis. No numerical approach of eye-blink artifact removal for single-channel EEG signal in time domain is developed. In this paper, we propose a time domain eye-blink artifact removal method for single-channel EEG signal using independent component analysis (ICA)-based templates. ICA and positive semidefinite tensor factorization (PSDTF) are employed in our proposed method. As a result, we obtain high signal-to-noise ratio (15.03dB) and low mean square error (25.76). Moreover, the optimal number of iterations on multiplicative update rules in PSDTF is about 20 to 30. A useful time domain eye-blink artifact removal method for single-channel EEG signal was proposed by using ICA-based PSD matrix templates. Improvement of eye-blink artifact removal accuracy and reduction of computational cost are our main future works.

Original languageEnglish
Title of host publication2015 10th Asian Control Conference
Subtitle of host publicationEmerging Control Techniques for a Sustainable World, ASCC 2015
EditorsHazlina Selamat, Hafiz Rashidi Haruna Ramli, Ahmad Athif Mohd Faudzi, Ribhan Zafira Abdul Rahman, Asnor Juraiza Ishak, Azura Che Soh, Siti Anom Ahmad
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479978625
DOIs
Publication statusPublished - 2015 Sept 8
Event10th Asian Control Conference, ASCC 2015 - Kota Kinabalu, Malaysia
Duration: 2015 May 312015 Jun 3

Publication series

Name2015 10th Asian Control Conference: Emerging Control Techniques for a Sustainable World, ASCC 2015

Other

Other10th Asian Control Conference, ASCC 2015
Country/TerritoryMalaysia
CityKota Kinabalu
Period15/5/3115/6/3

ASJC Scopus subject areas

  • Control and Systems Engineering

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