Influence of Na2Si2O5 on the hydration of C4AF with various surface areas

Kwang Suk You, Hirotaka Fujimori, Koji Ioku, Seishi Goto

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)


The hydration of C4AF having various surface areas was investigated with Na2Si2O5 solution. The hydration behavior of C4AF depended on the amount of silicate ions precipitated on its surface. The amount of precipitated silicate ions, which hindered the hydration of C4AF, was proportional to the surface area of C4AF. The precipitated silicate ions on the surface of C4AF were founded to be a silica-like material by means of X-ray photoelectron spectroscopy (XPS). They formed a layer approximately 3 nm thick on the surface of C4AF.

Original languageEnglish
Pages (from-to)64-67
Number of pages4
JournalMaterials Science Research International
Issue number2
Publication statusPublished - 2002 Jun
Externally publishedYes


  • Ferrite phase
  • Hydration reaction
  • Retardation
  • Silica layer
  • Sodium silicate
  • Surface area

ASJC Scopus subject areas

  • General Materials Science


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