TY - GEN
T1 - Invisible calibration pattern based on human visual perception characteristics
AU - Takimoto, Hironori
AU - Yoshimori, Seiki
AU - Mitsukura, Yasue
AU - Fukumi, Minoru
PY - 2010/11/18
Y1 - 2010/11/18
N2 - In the print-type steganographic system and watermark, a calibration pattern is arranged around contents where invisible data is embedded, as plural feature points corresponding to between an original image and the scanned image for normalization of the scanned image. However, it is clear that conventional methods interfere with page layout and artwork of contents. In addition, visible calibration patterns are not suitable for security service. In this paper, we propose an arrangement and detection method of an invisible calibration pattern based on characteristics of human visual perception. The calibration pattern is embedded to blue intensity in an original image by adding high frequency component.
AB - In the print-type steganographic system and watermark, a calibration pattern is arranged around contents where invisible data is embedded, as plural feature points corresponding to between an original image and the scanned image for normalization of the scanned image. However, it is clear that conventional methods interfere with page layout and artwork of contents. In addition, visible calibration patterns are not suitable for security service. In this paper, we propose an arrangement and detection method of an invisible calibration pattern based on characteristics of human visual perception. The calibration pattern is embedded to blue intensity in an original image by adding high frequency component.
UR - http://www.scopus.com/inward/record.url?scp=78149483411&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=78149483411&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2010.1023
DO - 10.1109/ICPR.2010.1023
M3 - Conference contribution
AN - SCOPUS:78149483411
SN - 9780769541099
T3 - Proceedings - International Conference on Pattern Recognition
SP - 4210
EP - 4213
BT - Proceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010
T2 - 2010 20th International Conference on Pattern Recognition, ICPR 2010
Y2 - 23 August 2010 through 26 August 2010
ER -