Ion conduction studies on LaF3 thin film by impedance spectroscopy

S. Selvasekarapandian; M. Vijayakumar; T. Gnanasekaran; Shinobu Fujihara; Shinnosuke Koji

doi:10.1016/S0921-4526(03)00323-5

Ion conduction studies on LaF₃ thin film by impedance spectroscopy

S. Selvasekarapandian, M. Vijayakumar, T. Gnanasekaran, Shinobu Fujihara, Shinnosuke Koji

Department of Applied Chemistry

Research output: Contribution to journal › Article › peer-review

17 Citations (Scopus)

Abstract

Lanthanum fluoride thin film has been prepared by vacuum thermal evaporation method. The hexagonal-phase LaF₃ film has been detected by using glancing angle XRD analysis. The XPS analysis confirms the composition of lanthanum fluoride. The F^- ion conduction through the grain and grain boundary has been analyzed using impedance analysis. The modulus spectra reveal the non-Debye nature and the distribution of relaxation times of the film.

Original language	English
Pages (from-to)	52-57
Number of pages	6
Journal	Physica B: Condensed Matter
Volume	337
Issue number	1-4
DOIs	https://doi.org/10.1016/S0921-4526(03)00323-5
Publication status	Published - 2003 Sept 1

Keywords

Impedance spectroscopy
Ion conduction
LaF
Thin films

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1016/S0921-4526(03)00323-5

Cite this

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abstract = "Lanthanum fluoride thin film has been prepared by vacuum thermal evaporation method. The hexagonal-phase LaF3 film has been detected by using glancing angle XRD analysis. The XPS analysis confirms the composition of lanthanum fluoride. The F- ion conduction through the grain and grain boundary has been analyzed using impedance analysis. The modulus spectra reveal the non-Debye nature and the distribution of relaxation times of the film.",

keywords = "Impedance spectroscopy, Ion conduction, LaF, Thin films",

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AU - Selvasekarapandian, S.

AU - Vijayakumar, M.

AU - Gnanasekaran, T.

AU - Fujihara, Shinobu

AU - Koji, Shinnosuke

PY - 2003/9/1

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N2 - Lanthanum fluoride thin film has been prepared by vacuum thermal evaporation method. The hexagonal-phase LaF3 film has been detected by using glancing angle XRD analysis. The XPS analysis confirms the composition of lanthanum fluoride. The F- ion conduction through the grain and grain boundary has been analyzed using impedance analysis. The modulus spectra reveal the non-Debye nature and the distribution of relaxation times of the film.

AB - Lanthanum fluoride thin film has been prepared by vacuum thermal evaporation method. The hexagonal-phase LaF3 film has been detected by using glancing angle XRD analysis. The XPS analysis confirms the composition of lanthanum fluoride. The F- ion conduction through the grain and grain boundary has been analyzed using impedance analysis. The modulus spectra reveal the non-Debye nature and the distribution of relaxation times of the film.

KW - Impedance spectroscopy

KW - Ion conduction

KW - LaF

KW - Thin films

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