Abstract
Interfaces of alumina-coated transition metals were studied by cross-sectional high-resolution electron microscopy (HREM) to investigate the lattice continuity across the interface, a-alumina films 2-3 am in thickness were coated on vanadium, niobium and tantalum polycrystals by the sputtering method. Cross-sectional HREM observations showed that there was a three-dimensional orientation relationship (3-D OR) between a-alumina films and substrate transition metals. The 3-D OR is discussed based on the coincidence of reciprocal lattice points of two adjoining crystals.
Original language | English |
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Pages (from-to) | L1301-L1304 |
Journal | Japanese journal of applied physics |
Volume | 34 |
Issue number | 10 |
DOIs | |
Publication status | Published - 1995 Oct |
Externally published | Yes |
Keywords
- A-alumina
- Coating
- High-resolution electron microscopy
- Interface
- Reciprocal lattice
- Sputtering
- Three-dimensional orientation relationship
- Transition metals
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)