Interfaces of alumina-coated transition metals were studied by cross-sectional high-resolution electron microscopy (HREM) to investigate the lattice continuity across the interface, a-alumina films 2-3 am in thickness were coated on vanadium, niobium and tantalum polycrystals by the sputtering method. Cross-sectional HREM observations showed that there was a three-dimensional orientation relationship (3-D OR) between a-alumina films and substrate transition metals. The 3-D OR is discussed based on the coincidence of reciprocal lattice points of two adjoining crystals.
- High-resolution electron microscopy
- Reciprocal lattice
- Three-dimensional orientation relationship
- Transition metals
ASJC Scopus subject areas
- Physics and Astronomy(all)