@inproceedings{514224ab36dd4f0bbdbee48944a1213d,
title = "Low-frequency dielectric relaxation in amorphous MoTe2layers obtained by RF magnetron sputtering",
abstract = "The results of a study on dielectric relaxation in thin layers of amorphous MoTe2 using dielectric spectroscopy are presented. Dipole-relaxation polarization has been observed. The activation energy of the relaxation process was calculated to be Ea = (0.44±0.02) eV. The dispersion of the dielectric constant and the presence of a maximum of dielectric losses in the studied MoTe2 films may be due to the disordered structure of the amorphous material and the presence of chalcogen vacancies. ",
author = "Rene Castro and Sergej Khachaturov and Aleksei Kononov and Yuta Saito and Paul Fons and Nadezhda Anisimova and Alexander Kolobov",
note = "Funding Information: This work was supported by the Russian Foundation for Basic Research, grant 19-07-00353 Publisher Copyright: {\textcopyright} 2020 Author(s).; 15th International Conference on Physics of Dielectrics, Dielectrics 2020 ; Conference date: 05-10-2020 Through 08-10-2020",
year = "2020",
month = dec,
day = "1",
doi = "10.1063/5.0033533",
language = "English",
series = "AIP Conference Proceedings",
publisher = "American Institute of Physics Inc.",
editor = "Yuriy Gorokhovatsky and Dmitry Temnov and Viktoria Kapralova and Nicolay Sudar and Elena Velichko",
booktitle = "Proceedings of the XV International Conference {"}Physics of Dielectrics{"}",
}