Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC

Shouhei Kousai; Kenichi Agawa; Hiroki Ishikuro; Hideaki Majima; Hiroyuki Kobayashi; Daisuke Miyashita; Takahisa Yoshino; Youichi Hama; Mototsugu Hamada

doi:10.1109/RFIC.2005.1489882

Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC

Shouhei Kousai, Kenichi Agawa, Hiroki Ishikuro, Hideaki Majima, Hiroyuki Kobayashi, Daisuke Miyashita, Takahisa Yoshino, Youichi Hama, Mototsugu Hamada

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Citations (Scopus)

Abstract

This paper describes the effect of digital noise on RF circuits on the singlechip Bluetooth SoC. Low frequency components in the digital noise, generated by I/O circuits accessing to an external memory, are found to be converted to the phase noise as the spurs of voltage controlled oscillator (VCO). The spurs bring the performance degradation of wireless communications systems. To manage the gain of the VCO and the coupling coefficient is shown to be a key to mitigate the performance degradations.

Original language	English
Title of host publication	2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers
Editors	A. Jerng
Pages	589-592
Number of pages	4
DOIs	https://doi.org/10.1109/RFIC.2005.1489882
Publication status	Published - 2005
Externally published	Yes
Event	2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers - Long Beach, CA, United States Duration: 2005 Jun 12 → 2005 Jun 14

Publication series

Name	Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
ISSN (Print)	1529-2517

Other

Other	2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers
Country/Territory	United States
City	Long Beach, CA
Period	05/6/12 → 05/6/14

Keywords

Bluetooth SoC
Digital noise
Phase noise
VCO

ASJC Scopus subject areas

Engineering(all)

Access to Document

10.1109/RFIC.2005.1489882

Cite this

Kousai, S., Agawa, K., Ishikuro, H., Majima, H., Kobayashi, H., Miyashita, D., Yoshino, T., Hama, Y., & Hamada, M. (2005). Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC. In A. Jerng (Ed.), 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers (pp. 589-592). Article RTUIFR-12 (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium). https://doi.org/10.1109/RFIC.2005.1489882

Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC. / Kousai, Shouhei; Agawa, Kenichi; Ishikuro, Hiroki et al.
2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers. ed. / A. Jerng. 2005. p. 589-592 RTUIFR-12 (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kousai, S, Agawa, K, Ishikuro, H, Majima, H, Kobayashi, H, Miyashita, D, Yoshino, T, Hama, Y & Hamada, M 2005, Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC. in A Jerng (ed.), 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers., RTUIFR-12, Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium, pp. 589-592, 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers, Long Beach, CA, United States, 05/6/12. https://doi.org/10.1109/RFIC.2005.1489882

Kousai S, Agawa K, Ishikuro H, Majima H, Kobayashi H, Miyashita D et al. Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC. In Jerng A, editor, 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers. 2005. p. 589-592. RTUIFR-12. (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium). doi: 10.1109/RFIC.2005.1489882

Kousai, Shouhei ; Agawa, Kenichi ; Ishikuro, Hiroki et al. / Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC. 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers. editor / A. Jerng. 2005. pp. 589-592 (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium).

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abstract = "This paper describes the effect of digital noise on RF circuits on the singlechip Bluetooth SoC. Low frequency components in the digital noise, generated by I/O circuits accessing to an external memory, are found to be converted to the phase noise as the spurs of voltage controlled oscillator (VCO). The spurs bring the performance degradation of wireless communications systems. To manage the gain of the VCO and the coupling coefficient is shown to be a key to mitigate the performance degradations.",

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Low frequency spurs of VCO due to noise propagation from digital I/O's and their effects on performance of Bluetooth SoC

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Keywords

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