Measurement of elliptically-polarized E-field waveforms in mid infrared range by electro-optic sampling

Kenichi Oguchi, Takayuki Kurihara, Marco Fischer, Shinichi Watanabe, Daniele Brida

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Electro-optic sampling (EOS) is a technique widely used to measure electric field waveform in ultra-broadband frequency range from terahertz (THz), mid- (MIR) [1], and near infrared (NIR) [2]. Since EOS signal depends on the relative orientations between probe, THz and crystal axis, the modulation of EOS signal upon crystal rotation provides polarization information of the infrared pulses [3, 4]. This so-called polarization-sensitive (PS-) EOS has an advantage that no additional polarization optics such as wire-grid polarizer is needed to measure polarization. In this talk we extend PS-EOS for the first time to the MIR region, wherein fruitful application possibilities such as vibrational circular dichroism [5] are expected.

Original languageEnglish
Title of host publicationJSAP-OSA Joint Symposia, JSAP 2018
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9784863486942
Publication statusPublished - 2018
EventJSAP-OSA Joint Symposia, JSAP 2018 - Nagoya, Japan
Duration: 2018 Sept 182018 Sept 21

Publication series

NameOptics InfoBase Conference Papers
VolumePart F125-JSAP 2018
ISSN (Electronic)2162-2701


ConferenceJSAP-OSA Joint Symposia, JSAP 2018

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials


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