Measurement of the thermal conductivity of nanometer scale thin films by thermoreflectance phenomenon

M. Kuwahara, O. Suzuki, Y. Yamakawa, N. Taketoshi, T. Yagi, P. Fons, T. Fukaya, J. Tominaga, T. Baba

Research output: Contribution to journal › Article › peer-review

38 Citations (Scopus)

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