TY - JOUR
T1 - MONTE CARLO SIMULATION OF SUBMICRON GaAs n + -i(n)-n + DIODE.
AU - Tomizawa, K.
AU - Awano, Y.
AU - Hashizume, N.
AU - Kawashima, M.
PY - 1982/1/1
Y1 - 1982/1/1
N2 - Monte Carlo simulation of electron transport in a GaAs diode, of n** plus -i(n)-n** plus structure, with a 0. 25 mu m- or 0. 5 mu m-long active layer is described. The anode voltage ranges from 0. 25 to 1. 0 v. The distributions of electron energies and electron velocities, and the profiles of the electron density, electric field, potenital, and average electron velocity are computed. Based on these data, the near ballistic nature of the electron transport in the 0. 25 mu m-long diode and the importance of the back-scattering of electrons from the anode n** plus -layer are discussed. The effects of the lattice temperature and doping on the length of the active layer, and a comparison with a Si diode are considered.
AB - Monte Carlo simulation of electron transport in a GaAs diode, of n** plus -i(n)-n** plus structure, with a 0. 25 mu m- or 0. 5 mu m-long active layer is described. The anode voltage ranges from 0. 25 to 1. 0 v. The distributions of electron energies and electron velocities, and the profiles of the electron density, electric field, potenital, and average electron velocity are computed. Based on these data, the near ballistic nature of the electron transport in the 0. 25 mu m-long diode and the importance of the back-scattering of electrons from the anode n** plus -layer are discussed. The effects of the lattice temperature and doping on the length of the active layer, and a comparison with a Si diode are considered.
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U2 - 10.1049/ip-i-1.1982.0029
DO - 10.1049/ip-i-1.1982.0029
M3 - Article
AN - SCOPUS:0020166703
SN - 0143-7100
VL - 129
SP - 131
EP - 136
JO - IEE Proceedings I: Solid State and Electron Devices
JF - IEE Proceedings I: Solid State and Electron Devices
IS - 4
ER -