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NanoBridge-Based FPGA in High-Temperature Environments

  • Makoto Miyamura
  • , Toshitsugu Sakamoto
  • , Xu Bai
  • , Yukihide Tsuji
  • , Ayuka Morioka
  • , Ryusuke Nebashi
  • , Munehiro Tada
  • , Naoki Banno
  • , Koichiro Okamoto
  • , Noriyuki Iguchi
  • , Hiromitsu Hada
  • , Tadahiko Sugibayashi
  • , Yuya Nagamatsu
  • , Soichi Ookubo
  • , Takuma Shirai
  • , Fumihito Sugai
  • , Masayuki Inaba

Research output: Contribution to journalArticlepeer-review

Abstract

The authors demonstrate a field-programmable gate array (FPGA) based on NanoBridge, a novel resistive-change switch. NanoBridge, which is integrated in the back end of line (BEOL), features a high on/off conductance ratio, weak temperature dependence of its resistance, nonvolatility, endurance against soft errors, and a small footprint. In place of static RAM (SRAM) and a pass transistor, NanoBridge is utilized as a configuration switch in the FPGA. In this article, the authors evaluate the NanoBridge-based FPGA (NB-FPGA) for applications in harsh environments. Specifically, they implemented NB-FPGA in a humanoid robot and compared its performance with that of the conventional FPGA. Results showed that NB-FPGA exhibits small variation in performance over a wide range of temperature, from-55 to 150 °C, and has high immunity for fluctuations in the power supply voltage.

Original languageEnglish
Article number8064998
Pages (from-to)32-42
Number of pages11
JournalIEEE Micro
Volume37
Issue number5
DOIs
Publication statusPublished - 2017 Sept 1
Externally publishedYes

Keywords

  • back end of line
  • BEOL devices
  • high temperature
  • noise
  • nonvolatile
  • rad-hard
  • radiation hardening
  • reconfigurable

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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