Nanometer-scale mapping of local work function with a photon-assisted STM technique

Yasuo Nakayama; Hiroshi Kondoh; Toshiaki Ohta

doi:10.1016/j.apsusc.2004.09.011

Nanometer-scale mapping of local work function with a photon-assisted STM technique

Yasuo Nakayama, Hiroshi Kondoh, Toshiaki Ohta

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

Local work-function mapping has been performed using scanning tunneling microscopy (STM) combined with visible laser light. Spatial distribution of the work function was visualized for inhomogeneous alkali-metal overlayers on a patterned Cu surface in a nanometer scale formed by nitrogen ion implantation. The spatial resolution of this technique is estimated to be in a sub-nanometer range.

Original language	English
Pages (from-to)	18-22
Number of pages	5
Journal	Applied Surface Science
Volume	241
Issue number	1-2 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.apsusc.2004.09.011
Publication status	Published - 2005 Feb 28
Externally published	Yes

Keywords

Alkali metals
Cu(1 0 0)
N implantation
Photo-assisted STM
Scanning tunneling microscopy
Work function

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Physics and Astronomy(all)
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/j.apsusc.2004.09.011

Cite this

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title = "Nanometer-scale mapping of local work function with a photon-assisted STM technique",

abstract = "Local work-function mapping has been performed using scanning tunneling microscopy (STM) combined with visible laser light. Spatial distribution of the work function was visualized for inhomogeneous alkali-metal overlayers on a patterned Cu surface in a nanometer scale formed by nitrogen ion implantation. The spatial resolution of this technique is estimated to be in a sub-nanometer range.",

keywords = "Alkali metals, Cu(1 0 0), N implantation, Photo-assisted STM, Scanning tunneling microscopy, Work function",

author = "Yasuo Nakayama and Hiroshi Kondoh and Toshiaki Ohta",

note = "Funding Information: The authors would like to thank Dr. T. Nakamura of National Institute of Advanced Industrial Science and Technology for useful discussion. This work was financially supported by The 21st Century COE Program from the Ministry of Education, Culture, Sports, Science and Technology.",

year = "2005",

month = feb,

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doi = "10.1016/j.apsusc.2004.09.011",

language = "English",

volume = "241",

pages = "18--22",

journal = "Applied Surface Science",

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TY - JOUR

T1 - Nanometer-scale mapping of local work function with a photon-assisted STM technique

AU - Nakayama, Yasuo

AU - Kondoh, Hiroshi

AU - Ohta, Toshiaki

N1 - Funding Information: The authors would like to thank Dr. T. Nakamura of National Institute of Advanced Industrial Science and Technology for useful discussion. This work was financially supported by The 21st Century COE Program from the Ministry of Education, Culture, Sports, Science and Technology.

PY - 2005/2/28

Y1 - 2005/2/28

N2 - Local work-function mapping has been performed using scanning tunneling microscopy (STM) combined with visible laser light. Spatial distribution of the work function was visualized for inhomogeneous alkali-metal overlayers on a patterned Cu surface in a nanometer scale formed by nitrogen ion implantation. The spatial resolution of this technique is estimated to be in a sub-nanometer range.

AB - Local work-function mapping has been performed using scanning tunneling microscopy (STM) combined with visible laser light. Spatial distribution of the work function was visualized for inhomogeneous alkali-metal overlayers on a patterned Cu surface in a nanometer scale formed by nitrogen ion implantation. The spatial resolution of this technique is estimated to be in a sub-nanometer range.

KW - Alkali metals

KW - Cu(1 0 0)

KW - N implantation

KW - Photo-assisted STM

KW - Scanning tunneling microscopy

KW - Work function

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DO - 10.1016/j.apsusc.2004.09.011

M3 - Article

AN - SCOPUS:12244313922

SN - 0169-4332

VL - 241

SP - 18

EP - 22

JO - Applied Surface Science

JF - Applied Surface Science

IS - 1-2 SPEC. ISS.

ER -

Nanometer-scale mapping of local work function with a photon-assisted STM technique

Abstract

Keywords

ASJC Scopus subject areas

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