TY - JOUR
T1 - Numerical analysis of band tails in nanowires and their effects on the performance of tunneling field-effect transistors
AU - Tanaka, Takahisa
AU - Uchida, Ken
N1 - Funding Information:
This work was partly supported by JSPS KAKENHI Grant Number 15H03997.
Publisher Copyright:
© 2018 The Japan Society of Applied Physics.
PY - 2018/6
Y1 - 2018/6
N2 - Band tails in heavily doped semiconductors are one of the important parameters that determine transfer characteristics of tunneling field-effect transistors. In this study, doping concentration and doing profile dependences of band tails in heavily doped Si nanowires were analyzed by a nonequilibrium Green function method. From the calculated band tails, transfer characteristics of nanowire tunnel field-effect transistors were numerically analyzed by Wentzel-Kramer-Brillouin approximation with exponential barriers. The calculated transfer characteristics demonstrate that the band tails induced by dopants degrade the subthreshold slopes of Si nanowires from 5 to 56mV/dec in the worst case. On the other hand, surface doping leads to a high drain current while maintaining a small subthreshold slope.
AB - Band tails in heavily doped semiconductors are one of the important parameters that determine transfer characteristics of tunneling field-effect transistors. In this study, doping concentration and doing profile dependences of band tails in heavily doped Si nanowires were analyzed by a nonequilibrium Green function method. From the calculated band tails, transfer characteristics of nanowire tunnel field-effect transistors were numerically analyzed by Wentzel-Kramer-Brillouin approximation with exponential barriers. The calculated transfer characteristics demonstrate that the band tails induced by dopants degrade the subthreshold slopes of Si nanowires from 5 to 56mV/dec in the worst case. On the other hand, surface doping leads to a high drain current while maintaining a small subthreshold slope.
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U2 - 10.7567/JJAP.57.06HC04
DO - 10.7567/JJAP.57.06HC04
M3 - Article
AN - SCOPUS:85047918997
SN - 0021-4922
VL - 57
JO - Japanese journal of applied physics
JF - Japanese journal of applied physics
IS - 6
M1 - 06HC04
ER -