Preface to Special Topic: Defects in Semiconductors

Tetsuya Yamamoto; Yasufumi Fujiwara; Kohei M. Itoh

doi:10.1063/1.5036660

Preface to Special Topic: Defects in Semiconductors

Tetsuya Yamamoto
, Yasufumi Fujiwara
, Kohei M. Itoh

Department of Applied Physics and Physico-Informatics

Research output: Contribution to journal › Editorial › peer-review

Original language	English
Article number	161301
Journal	Journal of Applied Physics
Volume	123
Issue number	16
DOIs	https://doi.org/10.1063/1.5036660
Publication status	Published - 2018 Apr 28

ASJC Scopus subject areas

General Physics and Astronomy

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10.1063/1.5036660

Cite this

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title = "Preface to Special Topic: Defects in Semiconductors",

author = "Tetsuya Yamamoto and Yasufumi Fujiwara and Itoh, \{Kohei M.\}",

year = "2018",

month = apr,

day = "28",

doi = "10.1063/1.5036660",

language = "English",

volume = "123",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "16",

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T2 - Defects in Semiconductors

AU - Yamamoto, Tetsuya

AU - Fujiwara, Yasufumi

AU - Itoh, Kohei M.

PY - 2018/4/28

Y1 - 2018/4/28

UR - https://www.scopus.com/pages/publications/85046400312

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DO - 10.1063/1.5036660

M3 - Editorial

AN - SCOPUS:85046400312

SN - 0021-8979

VL - 123

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 16

M1 - 161301

ER -

Preface to Special Topic: Defects in Semiconductors

ASJC Scopus subject areas

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