Quantification of pain degree using EEG with simple device

Junichiro Kagita, Yasue Mitsukura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The final aim of this paper is to quantify pain degree by only using Electroencephalogram (EEG) measured with simple device. Pain degree dominates the choice and assessment of a treatment in clinical care. It is conventionally quantified using pain rating scales, although they are not capable of attaining objective values. Therefore, a method which can quantify pain degree objectively has great importance. In this paper, the possibility of quantifying pain degree by only using EEG measured with simple device is proposed. The proposed method is in an easy manner considering its time consummation and procedures. Significant difference in EEG features between pain-free, painful, and psychologically painful state were confirmed as the results of the experiment, showing the possibility of attaining objective pain degree by using EEG measured with simple device.

Original languageEnglish
Title of host publicationProceedings - 2018 IEEE International Conference on Industrial Technology, ICIT 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2014-2017
Number of pages4
ISBN (Electronic)9781509059492
DOIs
Publication statusPublished - 2018 Apr 27
Event19th IEEE International Conference on Industrial Technology, ICIT 2018 - Lyon, France
Duration: 2018 Feb 192018 Feb 22

Publication series

NameProceedings of the IEEE International Conference on Industrial Technology
Volume2018-February

Other

Other19th IEEE International Conference on Industrial Technology, ICIT 2018
Country/TerritoryFrance
CityLyon
Period18/2/1918/2/22

Keywords

  • EEG
  • Pain

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

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